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    - Bit Error Ratio Test (BERT) Solutions
      - ParBERT 81250 (7)
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1-19 of 19

Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P This document describes the requirements for forward clocking topology RX Jitter tolerance testing. Application Note 2009-03-24	PDF 606 KB
Method of Implementation (MOI) for DisplayPort Sink Compliance Test Method of Implementation (MOI) for DisplayPort Sink Compliance Test Application Note 2008-08-18	PDF 1.87 MB
Measuring Jitter in Digital Systems (AN 1448-1) Measuring jitter and how to calculate total jitter. Application Note 2008-01-30	PDF 1.91 MB
How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY) How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY) Application Note 2007-07-30	PDF 611 KB
Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices Application Note 2007-06-19	PDF 214 KB
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A Software Platform: 8 pages Application Note 2007-01-31	PDF 272 KB
HDMI Sink and Source Compliance Test and Characterization In this product note examples are given for advanced, automated HDMI compliance tests and characterization based on a high bandwidth oscilloscope, a TMDS Signal Generator and the Test Automation Software Platform. Application Note 2006-10-27	PDF 431 KB Langues English \| 2006-10-27 \| PDF 431 KB 日本語 \| 2006-05-19 \| PDF 872 KB
Automated PCI Express Receiver Compliance Test and Characterization with N5990A This product note shows how to use the test automation software platform to verify and debug your PCI Express bus designs. As an example, a multi-lane add-in card is used. Application Note 2006-08-29	PDF 444 KB
Calibrated Jitter, Jitter Tolerance Test and Jitter Laboratory with the Agilent J-BERT N4903A This application note describes the N4903A BERT characterization solution for emerging serial gigabit devices: it helps engineers make quick and accurate jitter tolerance tests, which have been complicated and hard to do in the past. Application Note 2006-07-18	PDF 5.33 MB
PCIe Revision 2 Receiver Jitter Tolerance Testing with J-BERT N4903B This document focuses on physical layer testing of the transmitter (TX) and receiver (RX) ports of PCI EXPRESS® (PCIe) devices. Application Note 2006-01-30	PDF 1.31 MB Langues English \| 2006-01-30 \| PDF 1.31 MB 中文（简体） \| 2009-04-01 \| PDF 737 KB 中文（繁體） \| 2009-05-18 \| PDF 1.44 MB
Eye Characterization on Idle and Framed Data Traffic: the Bit Recovery Mode Traditionally, bit error rate testing compares the bits from a Device Under Test (DUT) against a reference data set, called the expected data. The user of Bit Error Ratio Tester (BERT) has to provide this expected data and load it into the tester. Application Note 2005-09-21	PDF 356 KB
Fast Total Jitter Test Solution This application note compares different total jitter measurement and extrapolation techniques to the Fast Total Jitter Measurement Application Note 2005-08-29	PDF 1.28 MB
PCI Express Receiver Design Validation Test with 81134A / 81250A Describes functional validation and compliance and stress tests for PCI Express receiver design Application Note 2005-03-18	PDF 2.01 MB Langues English \| 2005-03-18 \| PDF 2.01 MB 日本語 \| 2002-09-10 \| PDF 707 KB
Flat Panel Display Link Test This Product Note shows how to verify the Bit Error Rate (BER) of 1-serial to 7-parallel Rx chip with the Agilent 81250 Parallel Bit Error Ratio Tester (ParBERT). Application Note 2004-07-29	PDF 128 KB Langues English \| 2004-07-29 \| PDF 128 KB 中文（简体） \| 2003-08-19 \| PDF 1.36 MB
Jitter Fundamentals: Jitter Tolerance Testing with Agilent ParBERT 81250 This applicaiton note describes gain fast and efficient insight into the operation and performance of CDR, clock system and jitter tolerance. Application Note 2003-12-02	PDF 3.18 MB
Finding Sources of Jitter with Real-Time Jitter Analysis (AN 1448-2) This application note describes how to use a real-time oscilloscope with jitter analysis, along with the stimulus-response techniques, to meet the critical time-correlation requirement to relate jitter trend measurement results to measured signals. Application Note 2003-06-30	PDF 1.70 MB Langues English \| 2003-06-30 \| PDF 1.70 MB 日本語 \| 2003-09-22 \| PDF 1.51 MB
Jitter Analysis Techniques for High Data Rates (AN 1432) This new application note describes the basic jitter measurements and the specific measurement techniques used in SONet/SDH/OTN and Gigabit Ethernet applications. Application Note 2003-02-03	PDF 4 MB Langues English \| 2003-02-03 \| PDF 4 MB 日本語 \| 2003-04-28 \| PDF 1.65 MB
How to use the Agilent 81200 together with Agilent VEE This attached Product Note shows how to use the Agilent 81200 Data Generator/Analyzer together with Agilent VEE for Signal Integrity Analysis. Application Note 2002-01-28	PDF 383 KB
Measuring Jitter with the Agilent E4874A Characterization Software Components The Product Note shows how to measuring jitter with the Agilent E4874A Characterization Software Components on the Agilent 81200 Data Generator/Analyzer Platform. See also R & D Central at: http://www.agilent.com/find/randd Select "Bit Error Ratio Testing (BERT)" on that page. Then... Application Note 2000-06-01	PDF 102 KB