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Signal Generators (Signal Sources)
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1-25 of 26
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Signal Source Solutions for Coherent and Phase Stable Multi-Channel Systems Application Note
This application note discusses test signal requirements for the evaluation of multi channel RF systems.
Application Note 2010-05-05 |
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Typical GPS Receiver Verification Tests Using a GPS Signal Simulator - Application Note
This paper describes typical GPS receiver verification tests using a GPS signal simulator. The tests are used to verify functionality of embedded GPS receivers in mobile consumer products such as cell phones and other handheld receivers.
Application Note 2010-03-04 |
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GPS Receiver Testing - Application Note
This paper describes GPS receiver tests used for GPS verification. It also introduces an application capable of generating the required GPS signals for a repeatable and flexible test environment.
Application Note 2010-01-04 |
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Three Reasons to Migrate From Your 8662A/8663A to the E8663D RF Signal Generator
This application note demonstrates the advantages of the E8663D over the 8662A/8663A, giving you three compelling reasons to migrate: superior performance, enhanced usability, and modern supportability.
Application Note 2009-10-22 |
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Generating and Applying High-Power Output Signals
This application note describes both the inner workings of the PSG with Option 521 and the applications of its high-power output signals.
Application Note 2009-09-30 |
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Using MATLAB to Create Agilent Signal and Spectrum Analyzer Applications
Learn to use MATLAB software to configure, control, and acquire data from X-Series signal and spectrum analyzers, and then use scripts to create, modify and execute custom analyzer applications.
Application Note 2009-09-03 |
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Improved Methods for Measuring Distortion in Broadband Devices
This paper illustrates that, in broadband commercial and defense systems, it is more important than ever to characterize them for non-linearity.
Application Note 2008-12-10 |
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Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance
Application Note 2008-10-15 |
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Improving Throughput with Fast RF Signal Generator Switching
This note describes techniques for optimizing RF signal generators within ATE systems to reduce test times and improve throughput.
Application Note 2007-09-19 |
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Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note
Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB.
Application Note 2007-02-02 |
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Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs
Topics include balancing cost,
convenience and security in three
common LAN scenarios: sharing
instruments, remote monitoring and
data acquisition, and functional test
systems. Includes downloadable example programs.
Application Note 2005-04-01 |
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Using LAN in Test Systems: Setting up System I/O (AN 1465-15) - Application Note
This set of application notes shows
you how to simplify test system
integration by utilizing open connectivity standards such as local area networking (LAN). The collective goal of these notes is to help you produce reliable results, meet your throughput requirements and stay within your budget.
Application Note 2005-03-29 |
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Choosing Your Test System Software Architecture (AN 1465-4)
Application Note 2004-12-21 |
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Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note
This application note answers common questions
about the use of drivers and direct I/O to send commands from a PC application to the test instrument.
Application Note 2004-12-21 |
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Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note
Using SCPI and Direct I/O vs. Drivers,
the fifth note in the series, outlines
the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems
Application Note 2004-12-13 |
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Test-System Computer I/O Considerations (AN 1465-2) - Application Note
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing
Application Note 2004-12-09 |
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Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today
for connecting modern instrumentation to computers are GPIB, LAN, and USB.
Application Note 2004-11-19 |
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System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note
Using LAN in Test Systems: PC
Configuration,the third note in
the series, describes the additional
capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.
Application Note 2004-10-19 |
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Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note
The decision to use LAN in a test system delivers important benefits to your company and your team.
From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking
Application Note 2004-09-14 |
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Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.
Application Note 2004-07-29 |
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Radar Emitter Simulation Using the E8267C PSG Vector Signal Generator
This 32-page application note explains how to generate and evaluate complex radar signals using the Agilent E8267C vector signal generator.
Application Note 2003-12-01 |
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Radar Emitter Simulation Using Vector Signal Generators (MATLAB waveform examples)
Example of MATLAB files for generating complex waveforms (at ease) for radar system design verification using off-the-shelf microwave vector signal generators.
Analysis Tool 2003-11-12 |
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Testing and Troubleshooting Digital RF Communications Receiver Designs (AN 1314)
This Application Note covers the fundamental measurement principles involved in testing and troubleshooting digital communications
receivers, particularly those used in digital RF cellular systems. Measurement setups are provided for receiver performance tests and
troubleshooting tips are given.
Application Note 2002-03-25 |
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Signal Generator Spectral Purity Considerations in RF Communications Testing (AN 388)
This Tutorial is an Application note that describes what spectral purity is and its components. Using applications, the importance of good spectral purity is explained.
Application Note 2001-02-20 |
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Air Navigation Receiver Testing With The Agilent 8644A (AN 8644A-2)
This Application Note, for customers and field engineers, describes how to use the Agilent 8644A, 8645A, and 8665A signal generators to generate avionic test signals for marker beacon receivers.
Application Note 2000-09-01 |
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