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AXIe and PXI Modular Test Solution for Multiband SATCOM Monitoring - Application Note
This application overview will show how to simplify multiple satellite band monitoring and analysis using the Agilent AXIe M9703A high-speed digitizer, N5183A LO, and 89601B VSA software.

Application Note 2013-11-07

PDF PDF 1.16 MB
M9703A AXIe High-Speed Digitizer with Real-Time Digital Downconversion Capability - Application Note
This application note describes how to use the M9703A AXIe high-speed digitizer with real-time digital downconversion (DDC) capability to perform ultra-fast relative phase and gain measurements.

Application Note 2013-08-19

PDF PDF 5.48 MB
Creating a Complete and Flexible Solution for WiGig Testing Application Note
When developing new WiGig products, testing must address the transmitter and receiver portions of each device. In a tri-band device, signals have three key attributes: they operate at 2.4 GHz, 5.0 GHz

Application Note 2011-06-13

Switching Solutions
This paper discusses Agilent's complete line of switching solutions. Switch components are introduced, followed by the various scale of switch matrix that is required in RF and microwave testing.

Application Note 2010-11-18

Using MATLAB to Create Agilent Signal and Spectrum Analyzer Applications
Learn to use MATLAB software to configure, control, and acquire data from X-Series signal and spectrum analyzers, and then use scripts to create, modify and execute custom analyzer applications.

Application Note 2009-09-03

PDF PDF 1.11 MB
Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Application Note 2008-10-15

10 Practical Tips You Need to Know about Your Power Products - Application Note
Learn ten simple ways to improve your testing capabilities with your power supplies and electronic loads.

Application Note 2007-09-21

Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note
Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB.

Application Note 2007-02-02

Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs
Topics include balancing cost, convenience and security in three common LAN scenarios: sharing instruments, remote monitoring and data acquisition, and functional test systems. Includes downloadable example programs.

Application Note 2005-04-01

Using LAN in Test Systems: Setting up System I/O (AN 1465-15) - Application Note
This set of application notes shows you how to simplify test system integration by utilizing open connectivity standards such as local area networking (LAN). The collective goal of these notes is to help you produce reliable results, meet your throughput requirements and stay within your budget.

Application Note 2005-03-29

PDF PDF 263 KB
Choosing Your Test System Software Architecture (AN 1465-4) - Application Note
The information presented here will help you choose the direction for your software based on the application you have in mind and the amount of experience you have.

Application Note 2004-12-21

Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note
This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument.

Application Note 2004-12-21

PDF PDF 374 KB
Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note
Using SCPI and Direct I/O vs. Drivers, the fifth note in the series, outlines the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems

Application Note 2004-12-13

PDF PDF 408 KB
Test-System Computer I/O Considerations (AN 1465-2) - Application Note
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing

Application Note 2004-12-09

PDF PDF 189 KB
Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today for connecting modern instrumentation to computers are GPIB, LAN, and USB.

Application Note 2004-11-19

PDF PDF 194 KB
System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note
Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.

Application Note 2004-10-19

PDF PDF 204 KB
81100 Family of Pulse Pattern/Generators Radar Distance Test to Airborne Planes (PN 1) - App Note
This Product Note describes how a trigger pulse train of double pulses is sent from the control tower's radar system to an airplane.

Application Note 2004-10-12

PDF PDF
Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note
The decision to use LAN in a test system delivers important benefits to your company and your team. From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking

Application Note 2004-09-14

Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.

Application Note 2004-07-29

PDF PDF 270 KB
Airframe Testing (AN 1270-8)
Hundreds of strain and stress points on an airframe and wings are measured with a high-speed Agilent VXI Data Acquistion System. Description A newly designed aircraft must be thoroughly tested before it can be flown. Hydraulic stress testing is a common technique for checking the strength and...

Application Note 1995-06-01

PDF PDF 70 KB
Prototype Jet Engine Characterization (AN 1270-3)
In Application Note 1270-3 a 13 slot VXI Data Acquisition System is used during the testing of jet engine prototypes to log data on a multitude of performance parameters to refine design characteristics.

Application Note 1995-06-01

PDF PDF 48 KB
Jet Engine Testing (AN 1270-10)
Jet engine performance is measured under a wide range of operating conditions using HP VXI based systems and components. Description A jet engine is a complex machine, capable of producing thousands of pounds of thrust at altitudes from sea level to 50,000 feet. Some engines are designed...

Application Note 1995-06-01

PDF PDF 43 KB