Technical Support

Test e Misura

How Digitally Generated Faded Signals Reduce Cost of Test (R&D only) Reduce cost of test, simplify testing and be assured of accuracy using digitally integrated, calibrated noise and fading patterns. Application Note 2005-08-15	PDF 90 KB Languages English \| 2005-08-15 \| PDF 90 KB 日本語 \| 2007-01-29 \| PDF 276 KB 한국어 \| 2005-08-15 \| PDF 90 KB
Testing and Troubleshooting Digital RF Communications Transmitter Designs (AN 1313) This Application Note covers the following 3 topics: 1) How digital communications transmitters work, 2) Essential transmitter tests and important test equipment characteristics, and 3) Troubleshooting techniques for common impairments. Application Note 2002-01-08	PDF 957 KB Languages English \| 2002-01-08 \| PDF 957 KB 日本語 \| 2000-03-13 \| PDF 2.05 MB

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