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Probing High-Speed Signals with the 86100 Series of Wide-Bandwidth Sampling Oscilloscopes (86100-6)
Product Note 86100-6 discusses three important measurement accessories that help make probe-based measurements both simple and accurate for the Agilent 86100 Wide-Bandwidth Oscilloscope.

Application Note 2011-07-28

PDF PDF 651 KB
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Transient Optical Power Measurements with the N7744A and N7745A
This note shows how to measure transient and time-dependent optical signals, both of which are related to the fast sample rate and data throughput of the N7744A and N7745A multiport power meters.

Application Note 2010-11-12

PDF PDF 1.23 MB
Measuring IL and PDL spectra with the fast-switching N7786B
The advantages and details of a new method for swept-wavelength IL and PDL measurement is introduced, including configuration details for the necessary instruments and software.

Application Note 2009-04-10

PDF PDF 672 KB
Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.

Application Note 2009-03-24

PDF PDF 606 KB
Improving the Accuracy of Optical Transceiver Extinction Ratio Measurements (AN 1550-9)
This paper discusses extinction ratio - measurement challenges and causes of measurement uncertainty & variability. In addition, it describes methods for reducing uncertainties caused by non-ideal performance of standard reference receivers.

Application Note 2009-02-21

PDF PDF 672 KB
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Capturing the Fifth Harmonic: Tradeoffs Between Sampling and Real Time scopes
There is no simple way to decide how much oscilloscope bandwidth you will need. Scope vendors promote a “fifth harmonic” rule of thumb. They suggest you purchase a scope with sufficient bandwidth to capture the fifth harmonic of your signals.

Application Note 2009-02-20

PDF PDF 437 KB
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Using Equalization Techniques on Your Infiniium 90000A Series Oscilloscope
A transmitter sends a serial signal over a transmission channel (examples: backplane, cable) to a receiver. As the signal rate increases, the channel the signal travels through distorts the signal at the receiver.

Application Note 2009-02-17

PDF PDF 479 KB
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PCI Express® Revision 2 - Receiver Testing With J-BERT N4903A and 81150A Pulse

Application Note 2008-12-03

PDF PDF 1000 KB
Measuring Polarization Dependent Loss of Passive Optical Components
A new document on the methods of characterizing passive optical components.

Application Note 2008-12-01

PDF PDF 545 KB
Characterizing Clock Jitter through Phase Noise Measurements Speeds up Design Verification Process
This white paper discusses a new measurement method for obtaining highly accurate low random jitter (RJ) measurements and performing real-time analysis of RJ and periodic jitter (PJ) of components.

Application Note 2008-11-20

PDF PDF 688 KB
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Upgrade to PCI Express 2.0© Receiver Test
The 15431A is a filter set for the 81150A. It generates the random jitter profile for testing PCI Express 2.0 receivers, to be used in conjunction with the N4903A. This fact sheet explains the upgrade.

Application Note 2008-10-24

PDF PDF 348 KB
The Benefits of and Considerations for the Embedded CDR in the N5980A

Application Note 2008-09-16

PDF PDF 591 KB
Method of Implementation (MOI) for DisplayPort Sink Compliance Test
Method of Implementation (MOI) for DisplayPort Sink Compliance Test

Application Note 2008-08-18

PDF PDF 1.87 MB
On-Wafer Testing of Opto-Electronic Components Using LCA's
This document describes the principles of on-wafer measurements on opto-electronic components

Application Note 2008-08-13

PDF PDF 1.57 MB
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What is the difference between an equivalent time sampling oscilloscope and a real-time oscilloscope
This document will discuss how each type of scope samples the incoming waveform and explain the trigger requirements. A summary detailing the advantages of each scope is provided at the end.

Application Note 2008-07-08

PDF PDF 605 KB
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Calibrating optical stress signals for characterizing 10 Gb/s optical transceivers

Application Note 2008-06-10

PDF PDF 1.95 MB
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Laser Chirp
Chirp is a measure of the change in transmitter optical frequency as the transmitter is modulated.

Application Note 2008-06-04

MOI for SATA RSG Tests, SATA Interoperability Program Rev. 1.3
Agilent Method Of Implementation for SATA RSG Tests, Serial ATA Interoperability Program Revision 1.3

Application Note 2008-05-30

PDF PDF 2.17 MB
Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN) (PN 86100-7)

Application Note 2008-05-08

PDF PDF 1.22 MB
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Precision Waveform Analysis for High-Speed Digital Communications Technical Overview
his document will discuss the Agilent 86108A precision waveform analyzer plug-in module with the Agilent 86100C DCA-J sampling oscilloscope mainframe for accurate analysis of high-speed digital communications signals.

Application Note 2008-04-17

PDF PDF 1.88 MB
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Measuring Jitter in Digital Systems (AN 1448-1)
Measuring jitter and how to calculate total jitter.

Application Note 2008-01-30

PDF PDF 1.91 MB
101 of high speed optical component characterization
The application note gives you deep insight into the basics of electro-optical S-parameter test with the Lightwave Component Analyzer (LCA).

Application Note 2008-01-18

PDF PDF 1.93 MB
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Powering DC-to-DC Converters Using the Agilent N6705A DC Power Analyzer
This application brief describes an example of how an R&D engineer can test DC-to-DC converters using capabilities of the N6705A DC Power Analyzer.

Application Note 2007-04-11

PDF PDF 188 KB
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Precision Jitter Analysis Using the Agilent 86100C DCA-J (PN 86100C-1)
This product note provides a guide to making jitter measurements with the Agilent 86100C DCA-J.

Application Note 2007-03-07

PDF PDF 1.64 MB
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Comparison of Different Jitter Analysis Techniques With a Precision Transmitter
This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter.

Application Note 2006-04-06

PDF PDF 164 KB

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