Test & Messtechnik
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Impedance Measurement Handbook
Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers.
Application Note 2009-06-17
Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Agilent 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.
Application Note 2008-12-10
Evaluation of MOS Capacitor Gate Oxide C-V Characteristics Using the Agilent 4294A(PN4294-3)
As a result of extremely high integration of logic LSIs, MOS FETs with gate lengths of 0.1 mm or less have been produced recently. A consequence of this miniaturization has been the need for very thin gate oxide layers.
Application Note 2003-06-26
Network, Spectrum, and Impedance Evaluation of Electronic Circuits and Components (AN 1308-1)
This Application Note describes how the Agilent 4395A/96B can be used to contribute fast cycle time for electronic circuit/component development.
Application Note 2001-12-19
Measurement of Cable Characteristics (AN 30)
This Application Note is for information only. Agilent no longer sells or supports these products.
Application Note 1964-02-01
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