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Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers
This application note presents the technologies and methods for measuring permittivity and permeability. The document focuses on impedance measurement technology with the following advantages: Wide frequency range from 20Hz to 1GHz High measurement accuracy Simple preparations (fabrication of material, measurement setup) for measurement.

Application Note 2013-09-27

The Impedance Measurement Handbook-4th Edition - Application Note
This 140 page handbook is Agilent Technologies's most detailed information on the basics of impedance measurements using Agilent Technologies's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

Application Note 2013-09-10

Impedance and Network Analysis Application List Application Note
This document provides the information of unique and new solutions for impedance and network analysis with using Agilent impedance analyzers, LCR meters and ENA series network analyzers.

Application Note 2012-10-30

Impedance Measurements - Evaluating EMC Components with DC Bias Superimposed
This application note gives an overview on how to evaluate electromagnetic compatible (EMC) components in a way that satisfies strict EMC requirements. It also introduces various EMC measurement solutions.

Application Note 2009-02-03

Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Agilent 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

Application Note 2008-12-10

Wide-Range DC Current Biased Inductance Measurement (AN 369-8)
This application note describes DC current biased inductance measurements that are more accurate and made over a wider frequency range than was previously possible.

Application Note 2008-11-21

New Technologies for Accurate Impedance Measurement (40Hz to 110MHz)
Auto-balancing bridge method is the best technique to make an accurate impedance measurement in LF frequency. The recent technical innovation successfully expanded its upper frequency limitation from 40MHz to 110MHz. This Product Note discusses how its made and other new technologies included in...

Application Note 2008-11-20

Effective Transformer/LF Coil Testing (AN 1305-3)
Transformers/LF coils have gradually become miniaturized and are used in power supply circuits and digital networks(for example, ISDN), and are manufactured in increasing volume. QA and manufacturing have to improve evaluation of transformers/LF coils, but they are faced with big measurement...

Application Note 2008-11-20

Achieving Fast Design Cycle Time
This application note describes how fast cycle time is achieved using the impedance analyzer such as the E4991A and 4294A with the Electronic Design Automation (EDA) tools.

Application Note 2008-11-13

Balanced Circuit Measurement with an Impedance Analyzer/LCR Meter/Network Analyzer (AN 346-2)
This application note describes the difference between a balanced circuit and an unbalanced circuit, and also explains how to make an unbalanced circuit measurement by the unbalanced instrument step by step.

Application Note 2008-04-10

Contact Resistance and Insulation Resistance Measurements of Electromechanical Components (AN1305-1)
This application note describes the contact resistance and insulation resistance measurement of mechanical components.

Application Note 2008-04-03

Characterizing MEMS Magneto-Impedance Sensor using the Agilent Impedance Analyzer
This application brief describes the benefits of using Agilent impedance analyzers for device characterization of MEMS Magneto-Impedance (MI) sensors.

Application Note 2007-03-31

Impedance Characteristic Evaluation of SMD by Using the ENA with Inter-Continental Microwave (ICM)
This application note describes impedance characteristic evaluation of SMD by using the ENA RF network analyzer with the ICM test fixture.

Application Note 2006-11-29

Improve Electronic Product Quality and Performance with Agilent Precision LCR Meters (AN 369-9)
This note describes the general application of passive component measurements in incoming inspection and R&D and shows the benefits of Agilent's Precision LCR Meter family; the 4284A and the 4285A 30 MHz LCR meters with digital Q capability.

Application Note 2006-06-26

Evaluation of MOS Capacitor Gate Oxide C-V Characteristics Using the Agilent 4294A(PN4294-3)
As a result of extremely high integration of logic LSIs, MOS FETs with gate lengths of 0.1 mm or less have been produced recently. A consequence of this miniaturization has been the need for very thin gate oxide layers.

Application Note 2003-06-26

Network, Spectrum, and Impedance Evaluation of Electronic Circuits and Components (AN 1308-1)
This Application Note describes how the Agilent 4395A/96B can be used to contribute fast cycle time for electronic circuit/component development.

Application Note 2001-12-19

Effective Multitap Transformer Testing Using a Scanner (AN 1224-5)
This Application Note shows an effective multi-tap transformer measurement using a scanner and the Agilent 4263B LCR Meter.

Application Note 2001-11-05

High Accuracy and Fast RF Inductor Testing (AN 369-10)
This Application Note describes solutions offered by the Agilent 4285A Precision LCR Meter for realizing these requirements. Information for accurate and fast RF inductor testing, and for practical simple test systems are discussed.

Application Note 2001-10-25

Reliable Electronic Component Evaluation and Circuit Design with the 4294A(PN4294-1)

Application Note 2001-08-31

Accurate Impedance Measurement with Cascade Microtech Probe System(AN1369-3)
This 12 page application note explains how to make on-wafer or on-substrate 1-port impedance measurements using a probe station.The E4991A (1 M-3 GHz) and 4294A (40-110 MHz) solutions are discussed.

Application Note 2001-07-31

Advanced impedance measurement capability of the RF I-V method (AN 1369-2)
This application note describes the difference between the network analyzer and impedance analyzer for the measurement principle and actual measurement performance.

Application Note 2001-07-26

New Generation Analyzer Offers Exceptional and Powerful Analysis Functions for RF...(PN E4991A-1)
This Product Note describes the key technology of RF impedance measurement, today's RF component evaluation methodologies and advanced features of the E4991A product.

Application Note 2001-05-24

Electronic Characterization of Impedance Analyzer (AN 1300-5)
This application note describes in broad terms how to use the 4291B RF Impedance/Material Analyzer in determining the impedance characteristics of IC packages up to 1.8 GHz. This information is useful for high speed digital designers, component...

Application Note 2000-11-01

Effective Electrolytic Capacitors Testing (AN 1305-4)
With increased requirements for size reduction and higher reliability design, it is becoming necessary to evaluate electrolytic capacitors employed in electronic equipment. Production volume has been increasing for circuit applications. Manufacturing and QA now have to improve their testing of...

Application Note 2000-11-01

Optimizing Electronic Component and Material Impedance Measurements (AN 369-1)
Impedance measurements are a basic means of evaluating materials and electronic components that support the technical innovations of electronic instruments and equipment. Impedance characteristics of the components used in circuits or of materials vary with frequency, signal level, or the signal...

Application Note 2000-10-01


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