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Using the VISA COM I/O API in .NET - Application Note
The Microsoft .NET architecture has many features that make it an excellent environment for
Test & Measurement programmers. VISA COM
I/O is an update of the older VISA C API to work in and with COM technology.
應用手冊 2007-03-16 |
PDF
345 KB
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Applying a New In-Circuit Probing Technique for High-Speed/High Density Printed Circuit Boards
Bead probes were used to obtain additional test access on a high-density production printed circuit board. This case study includes practical information and key bead-specific learnings discovered during the process of outsourcing.
應用手冊 2006-10-24 |
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Bluetooth® RF Measurement Fundamentals (AN 1333-1)
Bluetooth® is an open specification for a wireless personal area network. It provides limited range RF connectivity for voice and data transmissions between information appliances.
應用手冊 2006-10-12 |
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PNA - Amplifier Swept-Harmonic Measurements (1408-8)
This application note cover testing an amplifiers harmonics, using (MW) PNA Series of vector network analyzers. Linear parameters, such as gain and return loss are covered in Application Note 1408-7.
應用手冊 2006-08-14 |
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ENA/PNA - Mixers - Calibration Accuracy using FCA (1408-3)
Improving Measurement and Calibration Accuracy Using the Frequency Converter Application - AN 1408-3
應用手冊 2006-08-08 |
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PNA - Amplifier Linear and Gain Compression Measurements (1408-7)
Application note covering testing of an amplifier's linear S-parameters and gain compression using Agilent's microwave PNA Series of vector network analyzers.
應用手冊 2006-08-08 |
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PNA - Amplifier-CW and Swept IMD Measurements (1408-9)
This application note covers testing an amplifier's intermodulation-distortion products, using (MW) PNA Series of vector network analyzers.
應用手冊 2006-08-08 |
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Considerations for Surface Map Setup
The concept of delta-Zs is perhaps the most difficult thing to understand about the surface map process.
應用手冊 2006-08-08 |
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Spectrum Analyzer Basics (AN 150)
Fundamentals of spectrum analyzer measurements
應用手冊 2006-08-02 |
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8510 Calibration - Measuring Noninsertable Devices (PN 8510-13)
The majority of devices used in real-world microwave systems are noninsertable because of the connectors employed.
應用手冊 2006-07-13 |
PDF
261 KB
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8510 Calibration Standard Definitions (AN 8510-5B)
This Product Note covers methods for specifying calibration standards and describes the procedures for their use with the Agilent 8510 Network Analyzer.
應用手冊 2006-07-13 |
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1.12 MB
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Fundamentals of RF and Microwave Power Measurements (Part 2) (AN 1449-2)
Power Sensors and Instrumentation AN 1449-2, literature number 5988-9214EN
應用手冊 2006-07-05 |
PDF
1010 KB
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SEMI S2 Standard Modifications for Agilent 3070 and Related Equipment
This document describes three items pertaining to the Agilent 3070 and the SEMI S2 standard. Each of them is related to a variance with the SEMI standard.
應用手冊 2006-06-15 |
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52 KB
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How to Use VXI and PXI in Your New LXI Test System (AN 1465-23)
應用手冊 2006-06-06 |
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Next-generation Test Systems: Advancing the Vision with LXI (AN 1465-16)
應用手冊 2006-05-01 |
PDF
263 KB
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AOI - A Strategy for Closing the Loop
This paper describes a set of defect prevention solutions centered on the availability of high-quality inspection and measurements data from an AOI system and a few carefully engineered software applications
應用手冊 2006-04-16 |
PDF
291 KB
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Comparison of Different Jitter Analysis Techniques With a Precision Transmitter
This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter.
應用手冊 2006-04-06 |
PDF
164 KB
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8753ET/ES and 8719D/ET/ES, 8720D/ET/ES, and 8722D/ET/ES Network Analyzers Security Features
Provides information concerning the structure, use, and clearing of user accessible memory inside the 8753ET/ES and 8719D/ET/ES, 8720D/ET/ES, and 8722D/ET/ES Network Analyzers.
應用手冊 2006-02-15 |
PDF
22 KB
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“Shotgunning”, a Bad Fit for Lead-Free Test
Shotgunning, a common repair technique in functional test, will be negatively affected by lead-free processes. This article explores the technique and draws broad conclusions regarding the impact of lead-free on electronics manufacturing test
應用手冊 2006-02-07 |
PDF
44 KB
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Network Analysis - In-Fixture Measurements (1287-9)
應用手冊 2006-01-10 |
PDF
920 KB
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PNA - Amplifier - High-Power Testing (1408-10)
應用手冊 2005-09-28 |
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How to Get the Most from Agilent's Intelligent Yield Enhancement Test (IYET)
This paper describes how to get the most from IYET for Agilent board test systems.
應用手冊 2005-07-15 |
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PNA - Analyze Lightwave Components (1408-14)
應用手冊 2005-06-30 |
PDF
471 KB
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AXI and Lead-Free Process Characterization
How to use Automated X-ray Inspection as a tool to characterize new lead-free soldering processes.
應用手冊 2005-06-21 |
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In-circuit Testing of Low Voltage Devices
Core technical document summarizing issues regarding the testing of low voltage devices on the 3070 and i5000, including updated Safeguard information.
應用手冊 2005-05-25 |
PDF
172 KB
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