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3070 Boundary Scan
Learn concepts of Boundary-Scan technology. TAP (test access port), the functionality of registers (BYPASS, boundary, IDCODE), and the structure of the "boundary-cell" are described.

Classroom Training

Agilent eventos en España
Bienvenido a la página de eventos organizados por Agilent en España.

Seminar

100G TX Designs - Tips & Techniques for Accurate Characterization Webcast
Original broadcast on February 27, 2013

Webcast - recorded

3070 Family Test Development Process
Learn to develop a board test program with the Agilent 3070 Family board test system.

Classroom Training

3070 Family WIN System Administration
Learn to successfully perform the tasks required of an Agilent 3070 Windows 2000 System Administrator. Understand the file system concepts and start-up/shutdown procedures. Discover the tools available to the system administrator.

Classroom Training

Advanced Product Design & Test for High-Speed Digital Devices Webcast
Original broadcast Jan 18, 2012

Webcast - recorded

Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
Originally broadcast Jan 27, 2011

Webcast - recorded

Back to Basics Part 2: Signal Generation
Original broadcast Feb 29, 2012

Webcast - recorded

Beyond CMOS vs. GaAs – Finding the Best Technology Mix for a Handset PA Webcast
Live broadcast June 13, 2013; 7am Pacific and 10am Pacific

Webcast

Bluetooth Technology Fundamentals
This 1-day course covers the applications for this new technology, the structure of the Bluetooth system architecture and the setup of so called short-range ad hoc networks will be introduced.

Classroom Training

Characterize and Correct for Cable, Switch and Test Fixture Loss Using Only a High-Bandwidth Scope
Originally broadcast July 27, 2011

Webcast - recorded

Digitizer Design Fundamentals for Superior Measurements
Original broadcast Mar 21, 2012

Webcast - recorded

Digitizing Oscilloscope Fundamentals
This class gives the student an in-depth understanding of the operation and measurement techniques with an Infiniium oscilloscope.

Classroom Training

Driving Down Test Cost, Schedule & Risk with Smart Switching
Original broadcast May 30, 2012

Webcast - recorded

Ethernet Compliance Testing: Become More Green and Energy Efficient Webcast
Original broadcast March 20, 2013

Webcast - recorded

Fundamentals of CDMA
This 2-day course covers the CDMA technology - its advantages and limitations.

Classroom Training

i5000 Sustaining Engineer

Classroom Training

In-circuit Test - Archived Event and Seminar Material

Webcast - recorded

Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs)
Original broadcast Feb 2, 2012

Webcast - recorded

Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast
Original broadcast May 7, 2013

Webcast - recorded

Innovations in EDA: Accelerating Radar/EW System Design using Wideband Virtual Scenarios Webcast
Original broadcast April 4, 2013

Webcast - recorded

Innovations in EDA: High Performance Digital Pre-Distortion (DPD) for Wideband Systems
Original broadcast Sept 1, 2011

Webcast - recorded

Interference Analysis Using Handheld Spectrum Analyzers Webcast
Original broadcast Sept 21, 2011

Webcast

Lead-Free Test and Inspection - Archived Event and Seminar Material

Webcast - recorded

Learn to Analyze, Validate and Debug High Speed DDR3 Memory
Original broadcast Oct 4, 2011

Webcast - recorded

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