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Agilent VEE Measurement Control Advanced
透過這門課程讓使用VEE有一段時間的工程師。能夠進一步了解何謂Standard Commands for Programmable Instruments (SCPI), Agilent Technologies I/O Library for Instrument Control以 及相互之間的關聯性。並且能夠練習利用C/C++ programming language寫Compiled Function讓VEE呼叫使用。

教室教育訓練

Introduction to Agilent VEE Pro
Learn to develop test software solve your test problems by developing programs with the Agilent Technologies' Visual Engineering Environment (Agilent VEE Pro). programming language.

教室教育訓練

可進行有效預測的測試範圍工具網路影片 – 讓您快速確認潛在的測試範圍與策略
原始播放時間為 2010 年 10 月 20 日

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提高模組化量測儀器效能之網路影片
提高模組化量測儀器效能之網路影片

網路廣播

擷取並分析信號波形活動
原始播放時間為 2009年 6 月 23 日

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Accelerate DDR4/LPDDR3 Memory Debug with Bus level Signal Integrity Insight Webcast
Original broadcast March 4, 2014

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Accelerating DDR4 Debug and Protocol Validation Webcast
Original webcast February 26, 2013

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Advanced Passive Intermodulation (PIM) Measurement System Webcast
Original broadcast August 29, 2013

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Advanced Product Design & Test for High-Speed Digital Devices Webcast
Original broadcast Jan 18, 2012

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All Webcast On-Demand Recordings
Access the free, On-Demand (recorded) webcasts

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Analyze Agile or Elusive Signals Using Real-time Measurement and Triggering Webcast
Original broadcast April 24, 2013

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Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
Originally broadcast Jan 27, 2011

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Basics of RF Amplifier Test With the Vector Network Analyzer
Original broadcast Mar 13, 2012

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Boundary Scan for Testing On-Board DDRs Webcast
Original broadcast October 22, 2013

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Boundary Scan Test Methods for DDR Memories
Originally broadcast May 18, 2010

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Calibration Webcast Series
What is Calibration? Why Calibrate? What do you really need? What should you ask for? Should you care about measurement uncertainty? What should you get back from a Cal lab? Please attend if you’d like to learn the answers to these questions!

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DesignCon 2014
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD

展覽會

Developing Measurement and Analysis Systems with Agilent Instruments Webcast
Original broadcast December 4, 2013

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Digitizer Design Fundamentals for Superior Measurements
Original broadcast Mar 21, 2012

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Driving Down Test Cost, Schedule & Risk with Smart Switching Webcast
Original broadcast May 30, 2012

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Effective Crosstalk Characterization Webcast
Original broadcast January 24, 2013

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In-circuit Test - Archived Event and Seminar Material

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Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs)
Original broadcast Feb 2, 2012

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International Microwave Symposium (IMS) 2014
June 1-16, 2014; Tampa Bay, Florida

展覽會

Learn about the latest i3070 ICT productivity tools from us, DeMille Research, and Derby Associates
Originally broadcast Aug 24, 2010

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