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Agilent VEE Measurement Control Advanced
透過這門課程讓使用VEE有一段時間的工程師。能夠進一步了解何謂Standard Commands for Programmable Instruments (SCPI), Agilent Technologies I/O Library for Instrument Control以 及相互之間的關聯性。並且能夠練習利用C/C++ programming language寫Compiled Function讓VEE呼叫使用。

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Introduction to Agilent VEE Pro
Learn to develop test software solve your test problems by developing programs with the Agilent Technologies' Visual Engineering Environment (Agilent VEE Pro). programming language.

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可進行有效預測的測試範圍工具網路影片 – 讓您快速確認潛在的測試範圍與策略
原始播放時間為 2010 年 10 月 20 日

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提高模組化量測儀器效能之網路影片
提高模組化量測儀器效能之網路影片

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擷取並分析信號波形活動
原始播放時間為 2009年 6 月 23 日

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.All Webcast On-Demand Recordings
Access the free, On-Demand (recorded) webcasts

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3070 Family Test Development Process
Learn to develop a board test program with the Agilent 3070 Family board test system.

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3070 Family WIN System Administration
Learn to successfully perform the tasks required of an Agilent 3070 Windows 2000 System Administrator. Understand the file system concepts and start-up/shutdown procedures. Discover the tools available to the system administrator.

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5DX Image Interpretation Training
Interpreting X-ray images and defect calls can be tricky, especially for operators who are new to automated X-ray inspection (AXI) technology.

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5DX Operator Training
The Agilent 5DX is one of the most advanced test systems on the planet. Here's where you'll get the baseline skills you need to use it productively.

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Accelerating DDR4 Debug and Protocol Validation Webcast
Original webcast February 26, 2013

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Advanced Product Design & Test for High-Speed Digital Devices Webcast
Original broadcast Jan 18, 2012

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Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
Originally broadcast Jan 27, 2011

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Basics of RF Amplifier Test With the Vector Network Analyzer
Original broadcast Mar 13, 2012

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Boundary Scan Test Methods for DDR Memories
Originally broadcast May 18, 2010

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Calibration Webcast Series
What is Calibration? Why Calibrate? What do you really need? What should you ask for? Should you care about measurement uncertainty? What should you get back from a Cal lab? Please attend if you’d like to learn the answers to these questions!

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Developing Measurement and Analysis Systems with Agilent Instruments Webcast
Original broadcast December 4, 2012

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Digitizer Design Fundamentals for Superior Measurements
Original broadcast Mar 21, 2012

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Driving Down Test Cost, Schedule & Risk with Smart Switching
Original broadcast May 30, 2012

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Effective Crosstalk Characterization Webcast
Original broadcast January 24, 2013

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EMC 2013 - IEEE International Symposium on Electromagnetic Compatibility
August 5- 9, 2013; Denver, CO

展覽會

i5000 Sustaining Engineer

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In-circuit Test - Archived Event and Seminar Material

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Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs)
Original broadcast Feb 2, 2012

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Learn about the latest i3070 ICT productivity tools from us, DeMille Research, and Derby Associates
Originally broadcast Aug 24, 2010

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