Test & Measurement
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Practical Analysis of Backplane Vias - White Paper
This paper describes the methodology of using measurements on a test vehicle to build a high bandwidth, scalable model of long vias which includes the through and stub effects which can be used for system simulation.
Case Study 2009-04-20
PDF 847 KB
Inphi Delivers Memory Interface Chip for DDR3-1600 Using Advanced Design System
This Success Story details how Inphi delivered memory interface chip for DDR3-1600 using Agilent’s Advance Design System (ADS).
Case Study 2009-03-12
PDF 196 KB
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