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An Innovative Simulation Workflow for Debugging High-Speed Digital Designs Using Jitter Separation
This paper presents a new simulation workflow for jitter separation analysis.

Application Note 2013-06-06

PDF PDF 606 KB
Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

Application Note 2013-05-31

PDF PDF 1.40 MB
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Agilent Method of Implementation (MOI) for 10GBASE-T Ethernet Cable Tests
Agilent Method of Implementation (MOI) for 10GBASE-T Cable Tests Using Agilent E5071C ENA Option TDR

Application Note 2013-05-21

PDF PDF 2.13 MB
USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Application Note 2013-05-10

PDF PDF 2.02 MB
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Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test
Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test Using Agilent E5071C ENA Network Analyzer Option TDR.

Application Note 2013-04-24

PDF PDF 2.02 MB
MOI for DisplayPort PHY CTS 1.2b Sink Tests
This document is provided "AS IS" and without any warranty of any kind, including, without limitation, any express or implied warranty of non-infringement, merchantability or fitness for a particular purpose. In no event shall VESA™ or any member of VESA be liable for any direct, indirect, special, exemplary, punitive, or consequential damages, including, without limitation, lost profits, even if advised of the possibility of such damages. This material is provided for reference only. VESA does not endorse any vendor’s equipment including equipment outlined in this document.

Application Note 2013-03-21

PDF PDF 7.99 MB
MOI for DisplayPort PHY CTS 1.2b Source Testing
This document is provided "AS IS" and without any warranty of any kind, including, without limitation, any expressed or implied warranty of non-infringement, merchantability or fitness for a particular purpose. In no event shall VESA™ or any member of VESA be liable for any direct, indirect, special, exemplary, punitive, or consequential damages, including, without limitation, lost profits, even if advised of the possibility of such damages. This material is provided for reference only. VESA does not endorse any vendor’s equipment, including equipment outlined in this document.

Application Note 2013-03-21

PDF PDF 5.63 MB
Agilent Method of Implementation (MOI) for DisplayPort Cable-Connector Assembly Compliance Test
Agilent Method of Implementation (MOI) for DisplayPort Cable-Connector Assembly Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR

Application Note 2013-02-18

PDF PDF 1.29 MB
Agilent Method of Implementation (MOI) for MHL Cables Compliance Tests
Agilent Method of Implementation (MOI) for MHL Cable Compliance Tests Using Agilent E5071C ENA Network Analyzer Option TDR

Application Note 2013-02-14

PDF PDF 1.76 MB
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DDR4 TdiVW/VdiVW Bit Error Rate Measurement or Understanding Bit Error Rate
Importance of making BER measurement calculations to form a statistical measurement of total jitter to understand the design's data valid window result and design error rates.

Application Note 2013-01-24

PDF PDF 1.65 MB
Agilent Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test
Agilent Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR

Application Note 2012-12-17

PDF PDF 1.82 MB
DDR Memory Overview, Development Cycle, and Challenges - Technical Overview
Thanks to improved manufacturing processes that have driven down costs, the technology of choice is now DDR SDRAM, short for Double Data Rate Synchronous Dynamic Random Access Memory.

Application Note 2012-12-14

PDF PDF 1.37 MB
Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity
Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity: How to Make the Most Accurate Digital Measurements When you select an oscilloscope for accurate, high-speed digital measurements, sampling fidelity can often be more important than maximum sample rate.

Application Note 2012-11-11

PDF PDF 1.56 MB
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Frequency Domain Analysis of Jitter Amplification in Clock Channels
Clock channel jitter amplification factor in terms of transfer function or S-parameters is derived. Amplification is shown to arise from smaller attenuation in jitter lower sideband than in the fundamental. Amplification scaling with loss is obtained.

Application Note 2012-11-01

PDF PDF 257 KB
Agilent Method of Implementation (MOI) for PCI Express 3.0 PCB Differential Trace Impedance Test
Agilent Method of Implementation (MOI) for PCI Express 3.0 PCB Differential Trace Impedance Test Using Agilent E5071C ENA Network Analyzer Option TDR

Application Note 2012-10-16

PDF PDF 1.62 MB
Explore the SERDES Design Space Using the IBIS AMI Channel Simulation Flow
Simulation of modern chip-to-chip links requires you abandon the SPICE-based approach and adopt a new approach based on an IBIS AMI channel simulation flow.

Application Note 2012-09-21

PDF PDF 467 KB
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S-parameter Series: Practical Application of the InfiniiSim Waveform Transformation Toolset Applicat
Presents and addresses five of the most common problems that confront engineers when trying to measure performance on high speed links, using an oscilloscope.

Application Note 2012-08-21

PDF PDF 9.77 MB
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Crossing the Digital-Analog Divide - White Paper
This white paper helps to better understand how to cope with the physical nature of signals that we might prefer to think of as bits, nibbles and bytes, let's start with an ideal digital waveform.

Application Note 2012-05-02

PDF PDF 6.46 MB
Which Electromagnetic Simulator Should I Use?
This paper outlines three of the key EM simulation technologies, MoM, FEM, FDTD and attempt to compare and contrast the relative merits of each.

Application Note 2012-04-06

PDF PDF 3.21 MB
Simulating FPGA Power Integrity Using S-Parameter Models
This application note describes how self-impedance (frequency) can easily be determined by simulating the frequency domain self-impedance profile of a Power Distribution Network (PDN).

Application Note 2012-04-02

PDF PDF 5.68 MB
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USB 3.0 Protocol Testing with Active Error Insertion Application Note
Speed up design and verification of USB designs using the U4612A Jammer

Application Note 2012-03-19

PDF PDF 3.51 MB
S-parameter Series: Using De-embedding Tools for Virtual Probing Application Note
Discusses using de-embedding tools to gain virtual access to difficult measurement points

Application Note 2012-03-11

PDF PDF 2.09 MB
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Transforming Oscilloscope Acquisitions for De-Embedding, Embedding and Simulating Channel Effects
Covers fundamentals of understanding the design parameters, the various methods of data acquisition and implementing the results into a first-class design

Application Note 2012-03-05

PDF PDF 2.33 MB
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S-parameter Series: S-parameter Requirements for Oscilloscope De-Embedding Applications
A tutorial in helping the reader achieve the big picture of interoperating oscilloscope data and how to understand its relationship to S-parameters

Application Note 2012-03-02

PDF PDF 2.13 MB
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S-parameter Series: Using the Time-Domain Reflectometer Application Note
Time Domain Reflectometers provide digital designers with powerful tools that display traditional impedance measurements and solutions that generate accurate S-parameter measurements -for de-embedding

Application Note 2012-03-01

PDF PDF 3.69 MB
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