Hable con un experto

Technical Support

Test y Medida

Find by Product Model Number: Examples: 34401A, E4440A

Refine the List

remove all refinements

By Application

By Type of Content

176-200 of 217

Sort:
Simplified Motor Spin-up Analysis (AN 1200-1)
This Application Brief offers the Agilent 53310A Modulation Domain Analyzer as a solution to the problem of characterizing a motor's performance without the need for external controller.

Application Note 2000-08-01

PDF PDF 100 KB
Languages 
Fundamentals of Modal Testing (AN 243-3)
This modal test 56 page Application Note provides an verview of structural dynamics theory, the measurement process for acquiring frequency response data, parameter estimation (curve fitting), and the analytical techniques of structural analysis and their relation to experimental testing (such...

Application Note 2000-05-01

PDF PDF 793 KB
Languages 
Testing CDMA Base Station Amplifiers (AN 1307)
The objective of this Application Note is to cover the basic measurement fundamentals of characterizing the linear and non-linear behavior of CDMA power amplifiers.

Application Note 2000-05-01

PDF PDF 523 KB
Languages 
Bearing Runout Measurements (AN 243-7)
This Application Note introduces the challenge of making runout measurements in disk drives, which is a critical step in increasing storage capacity. It explains the test setup required and shows measurements of repeatable and non-repeatable runout, synchronous and asynchronous runout, and...

Application Note 2000-05-01

PDF PDF 197 KB
Languages 
Phased Locked Loop Acquisition Using a Swept Local Oscillator
This Application Note details the Phased Locked Loop Acquisition Using a Swept Local Oscillator.

Application Note 2000-03-02

PDF PDF 440 KB
Languages 
Network Analysis - Mixers - Characterize Frequency-Translating Devices (AN 1287-7)
This Application Note explores current test equipment solutions and techniques that can be used to accurately characterize and test frequency-translating devices.

Application Note 2000-03-01

PDF PDF 529 KB
Languages 
Agilent TestJet Technology White Paper
This paper describes the Agilent TestJet technique, which makes use of a property of most digital ICs in use in the mid-1990s: the lead frame.

Application Note 2000-01-01

Reducing Load Time for Loaderless Systems
For Series 2L systems, it may be possible to reduce the time it takes to load a panel.

Application Note 1999-12-01

Low Cost Mixer for the 10.7 to 12.8 GHz Direct Broadcast Satellite Market (AN 1136)
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1999-11-01

PDF PDF 54 KB
A Low Cost, Surface Mount X-Band Mixer (AN 1052)
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1999-11-01

PDF PDF 35 KB
Printed Circuit Board Split-Pad Test Method and Design
This application note describes the split-pad concept for use with a bed of nails style test fixture.

Application Note 1999-06-01

PDF PDF 50 KB
Test Strategy for Complex Printed Circuit Board Assemblies
This paper proposes a new test strategy for complex boards since the trend in Printed Circuit Board Assembly (PCBA) technology is towards higher complexity.

Application Note 1999-02-22

PDF PDF 195 KB
Discreet Analog Device Testing
The Agilent 3070 series has quite a few built in features to make developing board tests easier, while protecting the operator, the board under test, and the 3070 itself from harm.

Application Note 1998-10-29

PDF PDF 26 KB
NDF and RTF - Hashed Names
There have been many questions about hashed directory names. This is a brief explanation of why they are, and how they are generated.

Application Note 1998-06-30

Boundary-Scan Technology, Justification, and Test Implementation for Designers
This paper provides practical insight for designers on the merits, design, and test implementation of Boundary-Scan Technology.

Application Note 1998-05-27

PDF PDF 29 KB
Effects of Lead Free Solders on Imaging Characteristics of the Agilent 5DX Laminographic X-ray Test
The electronics industry is under pressure to migrate solder processes away from the usage of eutectic tin-lead solder and towards utilization of lead-free compounds.

Application Note 1998-05-01

PDF PDF 83 KB
Boundary Scan Ground Bounce Suppression
Boundary-Scan circuitry, while in the process of testing interconnections, can set up and excite current surges on a board. This in turn can cause "ground bounce".

Application Note 1998-04-24

PDF PDF 14 KB
Fixture Interface Pin (MINT Pin) Maintenance
Fixture Interface Pins (MINT Pins) used in production testing will eventually get dirty enough to cause contact problems.

Application Note 1998-03-01

PDF PDF 20 KB
Use of the Test Results Command Processor
TRCMDPRO processes the results from the Agilent 5DX in a way that is specified by a command file. This file is TRCMDPRO.CMD. In addition to the software revisions named, the document applies to all 5DX software versions.

Application Note 1998-01-12

PDF PDF 20 KB
Effective Machinery Measurements Using Dynamic Signal Analyzers (AN 243-1)
This Application Note outlines the benefits of vibration analysis and provides basic information on making machinery measurements. It explains how vibration is converted to electrical signals and how the frequency domain helps users identify the comp. of signal. It also identifies the vibration...

Application Note 1997-12-01

PDF PDF 1.40 MB
RF Mixer Metasystem Behavioral Model
This Application Note describes the behavioral model of RF Mixer Metasystem.

Application Note 1997-04-03

PDF PDF 197 KB
3070 Increasing Throughput
There are decisions one can make that causes an Agilent 3070 test program to be slower or faster than what Test Consultant generates automatically. This paper offers many tips about how to optimize your system's performance.

Application Note 1997-03-03

PDF PDF 41 KB
How To Float, or Series, Agilent 3070 DUT Supplies
The Agilent 3070 development software does an amazing job of calculating the wiring needed to build fixtures. Even so there are occasionally cases which require wiring that the standard Agilent 3070 software can not handle.

Application Note 1997-01-23

PDF PDF 34 KB
Selective Retrieval for Agilent 3070 Board Test Systems with UNIX Controllers
Most users are very diligent about backing-up their systems in the event of a catastrophic disk failure. Typically, you use SAM to set-up periodic automated backups or create a "crontab" entry to do this.

Application Note 1996-07-01

Complete Analysis of Erbium-Doped Fiber Amplifiers
This Technical Paper discusses methods and instruments for measuring EDFAs with respect to gain and noise figure, both in static and dynamic form, polarization dependence, polarization mode dispersion, WDM characteristics and more. The influence of the spectral width of the laser source on the...

Application Note 1996-03-01

PDF PDF 142 KB

Previous 1 2 3 4 5 6 7 8 9 Next