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Test et mesure électronique

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IC-CAP Device Modeling Software
Technical overview of Agilent's Integrated Circuit Characterization and Analysis Program (IC-CAP), complete and accurate parameter extraction for semiconductor device modeling

Présentation technique 2012-12-20

PDF PDF 1.98 MB
Langues 
TS-8900 Automotive Electronics Functional Test System - Technical Overview
The TS-8900 provides higher throughput and higher test coverage while reducing your equipment capital costs for automotive electronics functional testing.

Présentation technique 2012-10-22

PDF PDF 1.01 MB
Langues 
TS-5400 Series II Automotive Electronics Functional Test System - Product Note
This product note is geared to helping automotiveelectronics manufacturers accelerate test systemdevelopment.

Présentation technique 2012-07-17

PDF PDF 420 KB
Langues 
TS-5020 Automotive Functional Test System - Technical Overview
This Product Note explains the TS-5020 and gives more information into its features.

Présentation technique 2012-07-12

PDF PDF 345 KB
Langues 
Solar Cell I-V Test System
Agilent I-V tester solution can measure the performance of various PV devices such as Silicon/ Thin film/ multi-junction in different power ranges.

Fiche signalétique 2009-06-22

PDF PDF 145 KB
Overview on Noise in Ring Topology Mixers
This Paper explores the formal definition of noise figure and shows the ADS noise figure definition, and also shows that the noise figure for a mixer does not have to exceed its conversion loss.

Présentation technique 2003-06-17

PDF PDF 234 KB
Overview on 1.6-mW LC-tuned VCO Design for 2.4GHz in 0.18-um RF CMOS Technology
The Paper details the design of the VCO using the Agilent ADS harmonic balance and Momentum simulators.

Présentation technique 2002-03-01

PDF PDF 687 KB
Overview on RF Circuits Integration using CMOS SOI 0.25 µm Technology
This Paper gives a brief overview of the Silicon On Insulator (SOI) technology and also introduces two RF designs performed successfully with 0.25μm SOI technology.

Présentation technique 2002-03-01

PDF PDF 515 KB
Overview on CMOS RFIC Upconversion Mixer Design
This Paper presents a mixer design using Agilent’s ADS 2001 Mixer DesignGuide. The Mixer DesignGuide was used to create simulation setups, data displays and impedance matching.

Présentation technique 2001-11-01

PDF PDF 367 KB
Overview on Modeling of a TSOP44 Package
This Paper presents a step-by-step tutorial based on the IC-CAP model detailing how to model a TSOP44 package using the test fixture.

Présentation technique 2001-09-01

PDF PDF 1.06 MB
Overview on Phase Noise and Jitter
This Paper by Rick Poore (Agilent Technologies) focuses on the relationship between phase noise and jitter in free-running oscillators.

Présentation technique 2001-05-17

PDF PDF 252 KB
Proposed System Solution for 1/f Noise Parameter Extraction
This paper describes a measurement setup for measuring the 1/f noise of Bipolar and MOS devices.

Présentation technique 2000-12-01

PDF PDF 628 KB
DesignGuides: Expert Help in the Time-to-Market Race
Agilent EEsof EDA DesignGuides data sheet

Fiche signalétique 1999-07-01

PDF PDF 1.91 MB
Designing to Digital Wireless Specifications using Circuit Envelope Simulation
This Paper by How-Siang Yap discusses the Circuit Envelope technology developed specifically to simulate modern wireless circuits with complex digitally modulated RF signals such as CDMA and TDMA.

Présentation technique 1998-06-01

PDF PDF 245 KB
Overview on Mixer Simulation with Agilent's ADS
This Technical Note covers some of the details required to simulate mixers with Agilent's Advanced Design System.

Présentation technique 1998-01-01

PDF PDF 250 KB
Overview on Low-Power Mixer Design Example using ADS
This Technical Overview describes a method for designing a low-power, single-transistor active mixer using ADS. It includes details on the design steps, simulation setups and data displays.

Présentation technique 1995-01-01

PDF PDF 521 KB