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Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Noise figure is a key performance parameter in many RF systems. This application note covers many topics related to noise figure measurements including the Y-factor method.

Application Note 2013-04-12

PDF PDF 1.36 MB
Fundamentals of RF and Microwave Noise Figure (AN 57-1)
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

Application Note 2010-08-05

PDF PDF 864 KB
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8 Hints for Making Better Spectrum Analyzer Measurements (AN 1286-1)
This application note provides eight pertinent hints for making better spectrum analyzer measurements such as measuring low level signals and indentifying internal distortion products.

Application Note 2009-09-07

PDF PDF 739 KB
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Impedance Measurement Handbook
Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers.

Application Note 2009-06-17

PDF PDF 2.02 MB
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Fundamentals of RF and Microwave Power Measurements (AN 1449)
Agilent's Fundamentals of RF and Microwave Power Measurements, application note (AN 1449-1/2/3/4).

Application Note 2009-06-05

Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Agilent 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

Application Note 2008-12-10

PDF PDF 283 KB
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Characterizing Clock Jitter through Phase Noise Measurements Speeds up Design Verification Process
This white paper discusses a new measurement method for obtaining highly accurate low random jitter (RJ) measurements and performing real-time analysis of RJ and periodic jitter (PJ) of components.

Application Note 2008-11-20

PDF PDF 688 KB
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PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12)

Application Note 2007-11-28

PDF PDF 1.23 MB
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4 Steps for Making Better Power Measurements (AN 64-4D)
Before selecting a power meter and associated sensors, make sure that you have taken the 4 steps detailed in this note, which influence the accuracy, economy and technical match to your application.

Application Note 2006-04-26

PDF PDF 995 KB
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Evaluation of MOS Capacitor Gate Oxide C-V Characteristics Using the Agilent 4294A(PN4294-3)
As a result of extremely high integration of logic LSIs, MOS FETs with gate lengths of 0.1 mm or less have been produced recently. A consequence of this miniaturization has been the need for very thin gate oxide layers.

Application Note 2003-06-26

PDF PDF 1.01 MB
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Obtain Flat-Port Power with Agilent's PSG User Flatness Correction or External Leveling Functions
The PSG series is ideally suited for design and test systems with high frequencies, wide bandwidths and complex modulation formats. This Product Note explains how to obtain flat...

Application Note 2003-02-04

PDF PDF 2.22 MB
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Network, Spectrum, and Impedance Evaluation of Electronic Circuits and Components (AN 1308-1)
This Application Note describes how the Agilent 4395A/96B can be used to contribute fast cycle time for electronic circuit/component development.

Application Note 2001-12-19

PDF PDF 666 KB
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Spectrum Analysis: Amplitude and Frequency Modulation (AN 150-1)
Modulation is the act of translating some low-frequency or base-band signal (voice, music, data) to a higher frequency. Why do we modulate signals? There are at least two reasons: to allow the simultaneous transmission of two or more baseband signals by translating them to different frequencies...

Application Note 2001-10-01

PDF PDF 1.23 MB
Investigating Bluetooth Modules: The First Step in Enabling Your Device with a Wireless Link
This Application Note is designed for vendors or manufacturers who plan to add a wireless link to their products by installing commercially-available, pre-built Bluetooth® modules into them.

Application Note 2001-09-30

PDF PDF 1.36 MB
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Fundamentals of RF and Microwave Power Measurements (AN 64-1C)
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 2001-04-16

PDF PDF 2.21 MB
346A/B/C Noise Sources: 10 MHz to 26.5 GHz
The attached document provides technical data for the Agilent 346A, 346B, and 346C Noise Sources ranging from 10 MHz to 26.5 GHz.

Application Note 2000-12-01

PDF PDF 500 KB
Extending Vector Signal Analysis to 26.5 GHz with 20 MHz Information Bandwidth (PN 89400-13)
This Product Note shows you how to configure, calibrate and operate a measurement system capable of wide bandwidth (up tp 20 MHz) vector signal analysis using the 89410A VSA & the 71910A Wideband Surveillance Receiver.

Application Note 2000-10-01

PDF PDF 569 KB
Choosing the Right Power Meter and Sensor
This product note outlines applications considerations and the newest sensor technologies. It also reviews the families of thermocouple, diode and two-path, diode-attenuator-diode sensors.

Application Note 2000-10-01

PDF PDF 433 KB
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89400 Series Vector Signal Analyzer Understanding Time and Frequency Domain Interactions
The intent of this Product Note is to provide a more intuitive feel for interactions among the time and frequency setup parameters of the Agilent 89400 Vector Signal Analyzers.

Application Note 2000-09-01

PDF PDF 159 KB
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Noise Power Ratio Measurements Using Agilent E2507B/E2508A Communications Signal Simulator (PN E2507B & PN E2508A)
The NPR measurement requires a stimulus source to generate conditioned noise and a measurement receiver to analyze the changes in the noise after it passes through the device under test. This Product Note shows how the Agilent E2507B or E2508A Multi-format Communications Signal Simulator...

Application Note 2000-08-01

PDF PDF 384 KB
TS-5550 Cellular Phone Functional Test Platform (PN TS-5550)
This 12-page color print on demand Product Note discusses the TS-5550 platform features and benefits, including the ability to test up to four celluar phones at once. It is a flexible system for rapid development of cellular phone functional test. Configuration and ordering structure is also given.

Application Note 2000-08-01

PDF PDF 6.88 MB
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Fundamentals of Time Interval Measurements (AN 200-3)
This classic Application Note provides a fundamental background on measurements of time-related events with electronic time interval counters. This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1997-06-01

PDF PDF 897 KB
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Timing Considerations in Color Distribution Networks (AN 1210-10)
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1992-09-01

PDF PDF 277 KB
5370B Universal Time Interval Counter (AN 191-7)
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1987-06-01

PDF PDF 8.34 MB
Using the 3585A Spectrum Analyzer with the 9825A Computing Controller (AN 246)
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1987-04-01

PDF PDF 1.18 MB

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