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모델번호로 검색: 예제: 34401A, E4440A

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Noise Figure Uncertainty Calculator
The noise figure uncertainty calculator has been created to aid your design work, from components through to systems, helping you meet the continued demand for higher system performance.

분석 툴 2014-05-19

Average Power Sensor Measurement Uncertainty Calculator - Application Note
Measurement Uncertainty Calculator for the Average Power Sensors (N8481A, N8482A, N8485A, N8481A-CFT, N8482A-CFT, N8485A-CFT, 8481D, 8485D, 8487D, R8486D, Q8486D, E4412A, E4413A, E9300A, E9301A, E9304A, E9300B, E9301B, E9300H, E9301H)

어플리케이션 노트 2014-03-25

XLS XLS 82 KB
Pulsed Carrier Phase Noise Measurements - Application Note
This application note discusses basic fundamentals for making pulsed carrier phase noise measurements.

어플리케이션 노트 2014-03-13

PDF PDF 1.97 MB
Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

어플리케이션 노트 2014-02-26

PDF PDF 1.48 MB
On-Wafer SOLT Calibration Using 4-port PNA-L Network Analyzers - Application Note
This documentation is intended for on-wafer applications using the 4-port, 20 GHz, PNA-L network analyzer with two dual probes to achieve full 4-port on-wafer calibrations manually. This application note provides the step-by-step instructions needed to set up a calibration kit in order to perform a 4-port SOLT (Short-Open-Load-Thru) calibration using only three thrus.

어플리케이션 노트 2014-02-06

Essential Capabilities of EMI Receivers - Application Note
What makes an EMI receiver fully compliant? This application note provides an overview of some of the most useful internal diagnostic tools for quickly & efficiently measuring unwanted emissions.

어플리케이션 노트 2013-10-14

PDF PDF 1.91 MB
Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers
This application note presents the technologies and methods for measuring permittivity and permeability. The document focuses on impedance measurement technology with the following advantages: Wide frequency range from 20Hz to 1GHz High measurement accuracy Simple preparations (fabrication of material, measurement setup) for measurement.

어플리케이션 노트 2013-09-27

Active Device Characterization in Pulse Operation Using the PNA/PNA-X - Application Note
This AN discusses pulsed S-parameter measurements using the PNA-X series and measurement techniques that enable power-dependent active device characterization including compression and distortion.

어플리케이션 노트 2013-06-19

Multichannel Measurements in MIMO 802.11ac Baseband IQ Simulation, Design & Test - Application Note
This solution brief will show Agilent Technologies' complete, end-to-end solution for multichannel measurements of 802.11ac BBIQ simulation, design and test.

어플리케이션 노트 2013-04-05

PDF PDF 748 KB
High-Accuracy Noise Figure Measurements Using the PNA-X Series Network Analyzer – App Note 1408-20
This application note discusses the unique challenges involved in minimizing noise figure.

어플리케이션 노트 2013-01-31

PDF PDF 2.54 MB
Vector Signal Analysis Basics
This application note serves as a primer on vector signal analysis. It covers VSA measurement concepts and theory of operation, general vector-modulation analysis and, digital-modulation analysis. Previously known as AN150-15.

어플리케이션 노트 2012-11-21

Impedance and Network Analysis Application List Application Note
This document provides the information of unique and new solutions for impedance and network analysis with using Agilent impedance analyzers, LCR meters and ENA series network analyzers.

어플리케이션 노트 2012-10-30

PDF PDF 1.11 MB
Wideband Digital Pre-Distortion with Agilent SystemVue and PXI Modular Instrument
Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools.

어플리케이션 노트 2012-10-15

임피던스 측정 핸드북

어플리케이션 노트 2012-07-06

Spectrum and Signal Analysis Pulsed RF Application Note 150-2
This application note is intended as an aid for the operation of spectrum and signal analyzers and the interpretation of the displayed pulse spectra.

어플리케이션 노트 2012-07-05

Innovative Passive Intermodulation (PIM) and S-parameter Measurement Solution with the ENA
This application note introduces the solution that combines PIM and S-parameter measurements by using the vector network analyzer.

어플리케이션 노트 2012-05-09

PDF PDF 2.28 MB
10 Hints for Making Successful Noise Figure Measurements (AN 57-3)
This document will help minimize the uncertainties in your noise figure measurements. Key topics include minimizing extraneous signals, mismatch uncertainties, nonlinearities, and path losses.

어플리케이션 노트 2011-12-21

Load Pull + NVNA = Enhanced X-Parameters for PA Designs
With high mismatch and technology-independent large-signal device models.

어플리케이션 노트 2011-09-08

Making EMI Compliance Measurements
This application note provides an overview of EMI compliance test requirements and measurement approaches.

어플리케이션 노트 2011-03-09

Custom OFDM Signal Generation Using SystemVue
This application note describes a new comms standard based on OFDM which is provided by SystemVue 2011 to create both simulation and measurement, with links to the new 89600B VSA software for further demodulation and analysis.

어플리케이션 노트 2010-12-09

Fundamentals of RF and Microwave Noise Figure (AN 57-1)
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

어플리케이션 노트 2010-08-05

Making Conducted and Radiated Emissions Measurements
This application note provides an overview of radiated and conducted emissions measurements as well as a methodology for EMI precompliance testing.

어플리케이션 노트 2010-07-13

A Simplified Extension of X-parameters to Describe Memory Effects for Wideband Modulated Signals
Model memory effects of microwave amplifiers in the case of wideband modulated signals.

어플리케이션 노트 2010-05-05

PDF PDF 616 Bytes
8 Hints for Making Better Spectrum Analyzer Measurements (AN 1286-1)
This application note provides eight pertinent hints for making better spectrum analyzer measurements such as measuring low level signals and indentifying internal distortion products.

어플리케이션 노트 2009-09-07

Solutions for Characterizing and Designing Linear Active Devices
This short application brief discusses how to accurately characterize a devices’ nonlinear behavior.

어플리케이션 노트 2009-08-21

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