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Fundamentals of RF and Microwave Noise Figure (AN 57-1)
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

어플리케이션 노트 2010-08-05

PDF PDF 864 KB
언어 
Fundamentals of RF and Microwave Power Measurements (AN 1449)
Agilent's Fundamentals of RF and Microwave Power Measurements, application note (AN 1449-1/2/3/4).

어플리케이션 노트 2009-06-05

Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

어플리케이션 노트 2008-10-15

PDF PDF 281 KB
언어 
Best of 8 Hints for Making Better Oscilloscopes Measurements
Agilent engineers sharing ideas of how to use the equipment they design

어플리케이션 노트 2008-03-17

PDF PDF 320 KB
How to Use IVI-COM Drivers in Agilent VEE Pro 8.0
This paper describe how easy to use IVI-COM driver in Agilent VEE Pro that allows instruments interchangeability while still providing quality and high performance.

어플리케이션 노트 2007-06-08

PDF PDF 295 KB
Spectrum Analyzer Basics (AN 150)
Fundamentals of spectrum analyzer measurements

어플리케이션 노트 2006-08-02

PDF PDF 3.71 MB
언어 
Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs
Topics include balancing cost, convenience and security in three common LAN scenarios: sharing instruments, remote monitoring and data acquisition, and functional test systems. Includes downloadable example programs.

어플리케이션 노트 2005-04-01

Using LAN in Test Systems: Setting up System I/O (AN 1465-15) - Application Note
This set of application notes shows you how to simplify test system integration by utilizing open connectivity standards such as local area networking (LAN). The collective goal of these notes is to help you produce reliable results, meet your throughput requirements and stay within your budget.

어플리케이션 노트 2005-03-29

PDF PDF 263 KB
Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note
This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument.

어플리케이션 노트 2004-12-21

PDF PDF 374 KB
Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note
Using SCPI and Direct I/O vs. Drivers, the fifth note in the series, outlines the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems

어플리케이션 노트 2004-12-13

PDF PDF 408 KB
Test-System Computer I/O Considerations (AN 1465-2) - Application Note
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing

어플리케이션 노트 2004-12-09

PDF PDF 189 KB
Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today for connecting modern instrumentation to computers are GPIB, LAN, and USB.

어플리케이션 노트 2004-11-19

PDF PDF 194 KB
System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note
Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.

어플리케이션 노트 2004-10-19

PDF PDF 204 KB
Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note
The decision to use LAN in a test system delivers important benefits to your company and your team. From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking

어플리케이션 노트 2004-09-14

PDF PDF 182 KB
언어 
Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.

어플리케이션 노트 2004-07-29

PDF PDF 270 KB
테스트 시스템 개발 가이드: 테스트 시스템 소프트웨어 아키텍쳐 선택하기

어플리케이션 노트 2004-05-07

PDF PDF 528 KB
언어 
How to use the Agilent 81200 together with Agilent VEE
This attached Product Note shows how to use the Agilent 81200 Data Generator/Analyzer together with Agilent VEE for Signal Integrity Analysis.

어플리케이션 노트 2002-01-28

PDF PDF 383 KB
8 More Hints for Making Better Scopes Measurements
This Application Note contains a variety of hints to help you understand and improve your use of oscilloscopes. It includes the following 8 hints: 1. Don't forget to check that probe 2. A quick, easy way to troubleshoot mixed hardware/software prototypes 3. Using scopes to measure noisy signals 4...

어플리케이션 노트 1999-12-01

PDF PDF 840 KB