Technical Support

Test & Measurement

W1910 LTE Boasband Verification Library, W1912 LTE Baseband Exploration The W1910EP/ET and W1912ET LTE baseband PHY libraries save time, reduce engineering effort and accelerate the maturity of baseband PHY designs for next-generation 3GPP LTE systems. Data Sheet 2009-07-27	PDF 884 KB Languages English \| 2009-07-27 \| PDF 884 KB 日本語 \| 2009-09-07 \| PDF 809 KB
Testing LTE TDD MIMO Systems Using ADS Connected Solutions This is a Technical Overview on testing LTE TDD MIMO systems using ADS Connected Solutions. Technical Overview 2009-07-13	PDF 238 KB Languages English \| 2009-07-13 \| PDF 238 KB 中文（简体） \| 2009-02-01 \| PDF 392 KB

Enroll in myAgilent
A personalized view into the information most relevant to you.
Register Your Product
Register your products for service notifications, firmware update alerts, application notes and more…
Why Buy Agilent
See how the Agilent Advantage adds value to your purchase.