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IC-CAP Device Modeling Software
Technical overview of Agilent's Integrated Circuit Characterization and Analysis Program (IC-CAP), complete and accurate parameter extraction for semiconductor device modeling
Technical Overview 2012-12-20
Proposed System Solution for 1/f Noise Parameter Extraction
This paper describes a measurement setup for measuring the 1/f noise of Bipolar and MOS devices.
Technical Overview 2000-12-01
PDF 628 KB
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