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Test et mesure électronique

IC-CAP Device Modeling Software Technical overview of Agilent's Integrated Circuit Characterization and Analysis Program (IC-CAP), complete and accurate parameter extraction for semiconductor device modeling Présentation technique 2012-12-20	PDF 1.98 MB Langues English \| 2012-12-20 \| PDF 1.98 MB 日本語 \| 2013-03-06 \| PDF 1.72 MB Pусский \| 2010-11-24 \| PDF 640 KB
Overview on RF Circuits Integration using CMOS SOI 0.25 µm Technology This Paper gives a brief overview of the Silicon On Insulator (SOI) technology and also introduces two RF designs performed successfully with 0.25μm SOI technology. Présentation technique 2002-03-01	PDF 515 KB
Overview on Modeling of a TSOP44 Package This Paper presents a step-by-step tutorial based on the IC-CAP model detailing how to model a TSOP44 package using the test fixture. Présentation technique 2001-09-01	PDF 1.06 MB
Proposed System Solution for 1/f Noise Parameter Extraction This paper describes a measurement setup for measuring the 1/f noise of Bipolar and MOS devices. Présentation technique 2000-12-01	PDF 628 KB

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