Technical Support

Test & Measurement

Agilent EEsof EDA Customer Education and Services Brief overview of Agilent EEsof EDA Customer Education and Services. Training Materials 2010-08-11
Agilent's Events for United Kingdom and Ireland Welcome to Agilent's Upcoming Events Page for United Kingdom and Ireland Seminar
EMC 2013 - IEEE International Symposium on Electromagnetic Compatibility August 5- 9, 2013; Denver, CO Tradeshow
IMS 2011 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue 2011 show, last June, 2011; Baltimore Convention Center Tradeshow
Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast Original broadcast May 7, 2013 Webcast - recorded
Measurement Based FET Modeling using Artifical Neural Networks (ANN) This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series. Seminar Materials 2012-02-07	PDF 2.51 MB
Presentation on DC & AC Characterization of Semiconductors This Presentation focuses on basics of device measurement and modeling techniques from DC to RF, special aspects of network analyzer calibration, de-embedding and required dummy structures. Seminar Materials 2003-01-28	PDF 893 KB
Test & Measurement events in Europe, Middle East & Africa Test & Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences. Seminar

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