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Evénements Agilent en France
Bienvenue sur la page des événements auxquels participe Agilent en France

Seminar

Advanced Product Design & Test for High-Speed Digital Devices Webcast
Original broadcast Jan 18, 2012

Webcast - recorded

Agilent EEsof EDA Customer Education and Services
Brief overview of Agilent EEsof EDA Customer Education and Services.

Training Materials 2010-08-11

Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
Originally broadcast Jan 27, 2011

Webcast - recorded

Breakthrough in High Speed Interconnect Analysis and Compliance Testing
Originally broadcast April 27, 2011

Webcast - recorded

EMC 2013 - IEEE International Symposium on Electromagnetic Compatibility
August 5- 9, 2013; Denver, CO

Tradeshow

Genesys Webcasts - "How-To-Design" series
Originally broadcast in 2009. Access the 6 WebEX recordings

Webcast - recorded

Hybrid-Active Load Pull with PNA-X and Maury Microwave
Original broadcast Jun 12, 2012

Webcast - recorded

IC-CAP User Training
This 3-day course will show device modelers how to use Agilent EEsof EDA's IC-CAP software. Click on link to view full course description and class dates and locations.

Classroom Training

IMS 2011 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue
2011 show, last June, 2011; Baltimore Convention Center

Tradeshow

Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast
Original broadcast May 7, 2013

Webcast - recorded

Measurement Based FET Modeling using Artifical Neural Networks (ANN)
This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series.

Seminar Materials 2012-02-07

PDF PDF 2.51 MB
New impedance measurement solutions & apps using 5 Hz to 3 GHz VNA
Originally broadcast April 19, 2011

Webcast - recorded

Nonlinear Characterization and Modeling Through Pulsed IV/S-Parameters
Original broadcast Mar 27, 2012

Webcast - recorded

Optimizing PXI Modular Functional Test System Throughput Webcast
Originally broadcast April 27, 2011

Webcast - recorded

PCI Express(R) 3.0 Strategies for Transmitter and Receiver Validation
Originally broadcast Feb 10, 2011

Webcast - recorded

Presentation on BSIM4, BSIM3v3 and BSIMSOI RF MOS Modeling
This Presentation by Dr. Thomas Gneiting (Advanced Modeling Solution) was presented at Agilent EEsof EDA Seminar, April 04, 2001 details the structure of BSIM3v3, BSIMSOI and BSIM4 RF models.

Seminar Materials 2001-04-04

PDF PDF 1.49 MB
Presentation on DC & AC Characterization of Semiconductors
This Presentation focuses on basics of device measurement and modeling techniques from DC to RF, special aspects of network analyzer calibration, de-embedding and required dummy structures.

Seminar Materials 2003-01-28

PDF PDF 893 KB
Setting Up IC-CAP WaferPro For On-Wafer Measurements
originally broadcast June 22, 2011

Webcast - recorded

Setting up IC-CAP WaferPro for On-Wafer Measurements
IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements.

Seminar Materials 2011-06-22

PDF PDF 3.07 MB
Test & Measurement events in Europe, Middle East & Africa
Test & Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.

Seminar