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N5412C Serial Attached SCSI-3 (SAS-3) Compliance Test Software - Data Sheet
The N5412C SAS-3 electrical test software simplifies the validation of SAS designs.

Fiche signalétique 2013-04-15

PDF PDF 1.19 MB
Signal Studio for Global Navigation Satellite Systems (GNSS) N7609B - Technical Overview
Create Agilent validated real-time signals that simulate satellites from the U.S. Global Positioning System (GPS), Russian Global Navigation Satellite System (GLONASS), or European Galileo system.

Présentation technique 2013-04-15

PDF PDF 2.23 MB
Command Expert Overview Video
This overview demonstrates the key features and shows how easy the software is to use.

Démonstration de base 2013-04-15

EMPro 3D EM Simulation Platform Support Roadmap
Agilent EEsof EDA EMPro 3D EM Simulation platform support roadmap

Guide de sélection 2013-04-15

PDF PDF 101 KB
N7649B Test Case Manager Online Documentation (.chm file)
Downloadable online documentation that includes technical overview, release notes, tutorials, installation information, and more.

Fichier d'aide 2013-04-15

USB and HSIC Protocol Triggering and Decode- Data Sheet
Extend your scope capability with Agilent's USB triggering and decode application. This application makes it easy to debug and test designs that include low, full, or high-speed USB protocols using your Infiniium 9000 scope.

Fiche signalétique 2013-04-14

PDF PDF 1.94 MB
Langues 
Cellular videos - LTE-A Videos
Agilent engineers are experts in test and focus on developing equipment and systems ahead of the technology wave. View these videos below to learn more about the intricacies of wireless from Agilent, and much more.

Démonstration de base 2013-04-14

Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Noise figure is a key performance parameter in many RF systems. This application note covers many topics related to noise figure measurements including the Y-factor method.

Notes d’application 2013-04-12

PDF PDF 1.36 MB
E6703I W-CDMA/HSPA Lab Application - Technical Overview
This technical overview provides the technical specifications and highlights the key capabilities of the E6703I W-CDMA/HSPA lab application.

Présentation technique 2013-04-11

PDF PDF 1.59 MB
Langues 
E1963A W-CDMA Mobile Test Application - Technical Overview
This technical overview provides key capabilities and specifications for the E1963A W-CDMA mobile test application.

Présentation technique 2013-04-11

PDF PDF 1.30 MB
Langues 
Model Quality Assurance (MQA)
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

Brochure 2013-04-10

PDF PDF 1.40 MB
Model Builder Program (MBP)
MBP is a one-stop solution that provides both automation and flexibility for silicon device modeling.

Brochure 2013-04-10

PDF PDF 1.76 MB
E5071C Network Analyzer & E5092A - Configurable Multiport Test Set Configuration Guide
This configuration guide describes standard configurations, options, accessories and peripherals for the ENA RF network analyzers.

Guide de configuration 2013-04-10

PDF PDF 1.54 MB
Langues 
E1962B cdma2000/IS-95/AMPS Mobile Test Application - Technical Overivew
This technical overview covers the technical specifications/features of E1962B cdma2000 mobile test application, E6702C cdma2000 lab application, and E5515C mainframe

Présentation technique 2013-04-10

PDF PDF 1.18 MB
J-BERT N4903B High-Performance Serial BERT - Data Sheet Version 1.3
This data sheet documents the capabilities of the N4906B, Agilent's high-performance serial BERT for R&D characterization compliance testing and for manufacturing volume ramp testing.

Fiche signalétique 2013-04-10

PDF PDF 1.90 MB
Langues 
E6702F cdma2000/IS-95/AMPS Lab Application - Technical Overview
This technical overview provides the specifications for the E6702F cdma2000, IS-95, and AMPS lab application to verify and ensure the quality of RF performance of these devices.

Présentation technique 2013-04-10

PDF PDF 767 KB
Langues 
Agilent 3-D EM Simulation Software Selected by STMicroelectronics for Integrated Passive Devices
Agilent announces that STMicroelectronics, a global semiconductor leader serving customers across the spectrum of electronics applications, has selected EMPro software for use in development of integrated passive devices (IPDs).

Dossier de presse 2013-04-09

E1968A GSM/GPRS/EGPRS Test Application - Technical Overview
This technical overview for the E1968A test application highlights key benefits, functionality, operating modes, and technical specifications.

Présentation technique 2013-04-09

PDF PDF 1.24 MB
EDA Support Services
Agilent Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.

Brochure 2013-04-09

PDF PDF 128 KB
Programmer's Guide for InfiniiVision 2000 X-Series Oscilloscopes (PDF)
This is a printable PDF version of the InfiniiVision 2000 X-Series Oscilloscopes Programmer's Guide.

Guide de programmation et de syntaxe 2013-04-05

PDF PDF 5.12 MB
Programmer's Guide for InfiniiVision 3000 X-Series Oscilloscopes (PDF)
This is a printable PDF version of the InfiniiVision 3000 X-Series Oscilloscopes Programmer's Guide.

Guide de programmation et de syntaxe 2013-04-05

PDF PDF 6.86 MB
2000 X-Series Oscilloscopes Advanced Training Guide
Lab guide and tutorial for making advanced oscilloscope measurements using an Agilent 2000 X-Series oscilloscope with the DSOXEDK training kit.

Manuel de l'utilisateur 2013-04-05

PDF PDF 4.19 MB
Programmer's Guide for InfiniiVision 2000 X-Series Oscilloscopes
This is a zipped Microsoft Windows® format help file. Extract this file to a Local Disk (a Windows security requirement); on Windows XP, you may have to open the file's Properties dialog and Unblock the file before opening.

Guide de programmation et de syntaxe 2013-04-05

ZIP ZIP 1.60 MB
Measuring Dielectric Properties using Agilent's Materials Measurement Solutions - Brochure
Quick guide for Agilent materials measurement solutions that can characterize the material under test by measuring dielectric properties such as permittivity and permeability.

Brochure 2013-04-05

PDF PDF 478 KB
Multichannel Measurements in MIMO 802.11ac Baseband IQ Simulation, Design and Test - Application Not
This solution brief will show Agilent Technologies' complete, end-to-end solution for multichannel measurements of 802.11ac BBIQ simulation, design and test.

Notes d’application 2013-04-05

PDF PDF 748 KB

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