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1-14 of 14

.All Webcast On-Demand Recordings Access the free, On-Demand (recorded) webcasts Webcast
Advanced Agilent VEE Pro This course will present detailed instruction, explanation and training for advanced programming of VEE Pro. Classroom Training
Advanced Product Design & Test for High-Speed Digital Devices Webcast Original broadcast Jan 18, 2012 Webcast - recorded
Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro Originally broadcast Jan 27, 2011 Webcast - recorded
Calibration Webcast Series What is Calibration? Why Calibrate? What do you really need? What should you ask for? Should you care about measurement uncertainty? What should you get back from a Cal lab? Please attend if you’d like to learn the answers to these questions! Webcast
Developing Measurement and Analysis Systems with Agilent Instruments Webcast Original broadcast December 4, 2012 Webcast - recorded
Driving Down Test Cost, Schedule & Risk with Smart Switching Original broadcast May 30, 2012 Webcast - recorded
EMC 2013 - IEEE International Symposium on Electromagnetic Compatibility August 5- 9, 2013; Denver, CO Tradeshow
Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs) Original broadcast Feb 2, 2012 Webcast - recorded
Introduction to Agilent VEE Pro Learn to develop test software with Agilent Technologies' Visual Engineering Environment (Agilent VEE Pro). Classroom Training
Setting Up IC-CAP WaferPro For On-Wafer Measurements originally broadcast June 22, 2011 Webcast - recorded
The Importance and Value of PXI Multi-Vendor Interoperability Original broadcast March 28, 2012 Webcast - recorded
Tools and Tips for Ensuring Reliable Sensor Measurements and Logging Systems Original broadcast Mar 20, 2012 Webcast - recorded
Top Considerations to Integrating a PXI Automated Test System Original broadcast Apr 24, 2012 Webcast - recorded

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