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RDX Test Solutions for DigRF - Data Sheet
DigRF v4 is rapidly emerging as the next-generation serial interface between mobile baseband and RF chips. It is designed for use in high bandwidth mobile systems incorporating air interface standards such as LTE and WiMAX.
Data Sheet 2013-05-13
E2960B Series for PCI Express 2.0 - Data Sheet
The Protocol Test Series encompasses the industry's most complete and integrated x1 through x16 protocol analyzer and LTSSM (Link Training and Status State Machine) exerciser for superior midbus and solid slot probing. This data sheet supports Windows 7.
Data Sheet 2011-11-03
L4532A & L4534A High Resolution LXI Digitizers
Technical specifications for L4532A and L4534A 20 MS/s LXI digitizer.
Data Sheet 2011-06-09