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Test et mesure électronique
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176-200 of 763
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Agilent to Demonstrate Newest Test Solutions for MW, RF, Wireless, Radar at European Microwave Week
Agilent announces that it will show its newest test and measurement solutions in microwave, RF, wireless and radar for telecommunications, transportation and medical markets at European Microwave Week.
Press Materials 2011-09-27 |
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IHP Expands its SiGe Process Design Kit Offerings for Use with ADS 2011 Software Release
Innovations for High Performance Microelectronics (IHP) announces the availability of leading-edge ADS PDKs for its 0.25 μm SiGe process (SG25H3) and 0.13 μm SiGe process (SG13S).
Press Materials 2011-09-20 |
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Order your complimentary 2012/13 RF & Microwave Test Accessories Catalog
This comprehensive resource enables engineers to quickly and conveniently research the highest-quality RF and microwave test accessories in the industry.
Catalog 2011-09-20 |
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Load Pull + NVNA = Enhanced X-Parameters for PA Designs
With high mismatch and technology-independent large-signal device models.
Application Note 2011-09-08 |
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W2341 Momentum G2 Element W2343 Momentum Turbo Element
Momentum G2 is the improved, second generation release of the powerful Momentum 3D planar electromagnetic simulator from Agilent EEsof EDA. Momentum Turbo further accelerates the simulation of Momentum G2 by over 6x through parallel computing on up to eight nodes of a compute cluster. This is especially useful for large simulations of complex boards or packages for signal integrity applications.
Brochure 2011-09-06 |
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Lib Test in Model Quality Assurance
This application note describes how to run quick checking on the model libraries by using the Lib Test feature in Model Quality Assurance (MQA). Knowledge Center login required.
Application Note 2011-09-01 |
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Agilent Technologies Introduces Wideband DPD Modeling Platform for LTE-Advanced, 802.11ac
Agilent announces the newest release of its W1716 DPD software, designed to enable the high levels of wireless performance necessary for emerging wideband standards such as LTE-Advanced and IEEE 802.11ac.
Press Materials 2011-08-31 |
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Fidus Systems Offers Customers Industry-leading RF Product Development and Signal Integrity
Utilizing Agilent Technologies' Advanced Design System further strengthens Fidus' extensive RF design and tool set
Press Materials 2011-08-25 |
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Agilent EEsof EDA Premier Communications Design Software
Agilent EEsof EDA premier communications design software product overview brochure.
Brochure 2011-08-03 |
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Batch Mode Application
This application note describes how to batch run multiple tasks in Model Quality Assurance (MQA). Knowledge Center login required.
Application Note 2011-08-01 |
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Optimization Weight Setting
This application note describes how to set weight in Model Builder Program (MBP). Knowledge Center login required.
Application Note 2011-08-01 |
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Adding Additional Instance Parameters
This application note describes how to add additional instance parameters in Model Builder Program (MBP). Knowledge Center login required.
Application Note 2011-08-01 |
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TMI Aging Model Application
This application note describes how to implement a TSMC Modeling Interface (TMI) aging model in Model Builder Program (MBP). Knowledge Center login required.
Application Note 2011-08-01 |
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Accounting for Dynamic Behavior in FET Device Models
This application note shows that one of the easiest and most insightful ways of testing the large-signal high-frequency capabilities.
Article 2011-07-25 |
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W1719 SystemVue RF System Design Kit
The W1719 brings fast nonlinear X-parameters (ADS) and Fast Circuit Envelope models (GoldenGate) into the dataflow environment, for system-level verification.
Data Sheet 2011-07-25 |
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GoldenGate 2011.07 Release Notes
GoldenGate 2011.07 Product Release Notes.
Release Notes 2011-07-12 |
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Multiple Simulations in MBP
This application note describes how to compare two or more different models in Model Builder Program (MBP). Knowledge Center login required.
Application Note 2011-07-01 |
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Generate and Tweak Corner Models
This application note describes how to generate and tweak corner models in Model Builder Program (MBP). Knowledge Center login required.
Application Note 2011-07-01 |
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Advanced Graph Export
This application note describes how to customize the report to be exported in Model Builder Program (MBP). Knowledge Center login required.
Application Note 2011-07-01 |
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Implementing Verilog-A Models in MBP
This application note describes how to implement Verilog-A models in Model Builder Program (MBP). Knowledge Center login required.
Application Note 2011-07-01 |
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Implementing MOSRA Models in MBP
This application note describes how to implement a MOS reliability analysis (MOSRA) model in Model Builder Program (MBP). Knowledge Center login required.
Application Note 2011-07-01 |
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Binned Model Generation and Tweaking
This application note describes how to generate and tweak binning models in Model Builder Program (MBP). Knowledge Center login required.
Application Note 2011-07-01 |
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Aerospace/Defense Radar Test Solutions from Agilent
This brochure describes Agilent’s commitment to, and solutions for, the Aerospace/Defense market worldwide.
Brochure 2011-06-24 |
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Solutions for Ultra-Wideband Radar System Design
This “Solutions for Ultra-Wideband Radar System Design” application note explains how to integrate design with ultra-wideband test for flexible radar verification.
Application Note 2011-06-24 |
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Agilent Technologies Advances X-Parameters Innovations
Agilent announces the latest wave of X-parameter innovations designed to further advance their use and support the industry's rapidly increasing interest in the technology.
Press Materials 2011-06-08 |
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