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Simulating High-Speed Serial Channels with IBIS-AMI Models
This paper reviews some of the benefits and limitations of using IBIS models and introduces the new AMI extensions to the latest IBIS version 5.0 specification.

Application Note 2011-11-15

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Demo 2011-11-11

Agilent Technologies to Demonstrate Solutions at MILCOM
Agilent announces it will demonstrate its latest military communications test technologies and tools at MILCOM, Nov. 7-10, at the Baltimore Convention Center (Booth 1201) in Baltimore.

Press Materials 2011-11-01

Overview of Typical ADS PDK Features
Agilent EEsof EDA is supported by all major foundries for complete MMIC and RFIC Design.

Brochure 2011-10-18

PDF PDF 367 KB
Latest RF Design and 3-D EM Simulation Platforms Enhance Multi-technology Design, Speed Simulation
Agilent announces new versions of Advanced Design System (ADS) and Electromagnetic Professional (EMPro) software.

Press Materials 2011-10-10

Agilent Technologies Introduces First Complete and Compliant 60 GHz Wireless Test Solution
Agilent announces the first complete and compliant test solution for 60-GHz wireless devices, including WiGig, WirelessHD and IEEE 802.11ad devices.

Press Materials 2011-10-10

TowerJazz Expands its High Speed SiGe, SOI and RF CMOS Design Kits for use with ADS 2011
TowerJazz Press Release

Press Materials 2011-10-06

PDF PDF 104 KB
Loading Multi-Die Data in MBP
This application note describes how to set up the script-based environment so that MBP can load and utilize ET data. Knowledge Center login required.

Application Note 2011-10-01

Agilent to Demonstrate Newest Test Solutions for MW, RF, Wireless, Radar at European Microwave Week
Agilent announces that it will show its newest test and measurement solutions in microwave, RF, wireless and radar for telecommunications, transportation and medical markets at European Microwave Week.

Press Materials 2011-09-27

IHP Expands its SiGe Process Design Kit Offerings for Use with ADS 2011 Software Release
Innovations for High Performance Microelectronics (IHP) announces the availability of leading-edge ADS PDKs for its 0.25 μm SiGe process (SG25H3) and 0.13 μm SiGe process (SG13S).

Press Materials 2011-09-20

PDF PDF 115 KB
Load Pull + NVNA = Enhanced X-Parameters for PA Designs
With high mismatch and technology-independent large-signal device models.

Application Note 2011-09-08

Lib Test in Model Quality Assurance
This application note describes how to run quick checking on the model libraries by using the Lib Test feature in Model Quality Assurance (MQA). Knowledge Center login required.

Application Note 2011-09-01

Agilent Technologies Introduces Wideband DPD Modeling Platform for LTE-Advanced, 802.11ac
Agilent announces the newest release of its W1716 DPD software, designed to enable the high levels of wireless performance necessary for emerging wideband standards such as LTE-Advanced and IEEE 802.11ac.

Press Materials 2011-08-31

Fidus Systems Offers Customers Industry-leading RF Product Development and Signal Integrity
Utilizing Agilent Technologies' Advanced Design System further strengthens Fidus' extensive RF design and tool set

Press Materials 2011-08-25

TMI Aging Model Application
This application note describes how to implement a TSMC Modeling Interface (TMI) aging model in Model Builder Program (MBP). Knowledge Center login required.

Application Note 2011-08-01

Batch Mode Application
This application note describes how to batch run multiple tasks in Model Quality Assurance (MQA). Knowledge Center login required.

Application Note 2011-08-01

Adding Additional Instance Parameters
This application note describes how to add additional instance parameters in Model Builder Program (MBP). Knowledge Center login required.

Application Note 2011-08-01

Optimization Weight Setting
This application note describes how to set weight in Model Builder Program (MBP). Knowledge Center login required.

Application Note 2011-08-01

Accounting for Dynamic Behavior in FET Device Models
This application note shows that one of the easiest and most insightful ways of testing the large-signal high-frequency capabilities.

Article 2011-07-25

PDF PDF 585 KB
W1719 SystemVue RF System Design Kit
The W1719 brings fast nonlinear X-parameters (ADS) and Fast Circuit Envelope models (GoldenGate) into the dataflow environment, for system-level verification.

Data Sheet 2011-07-25

GoldenGate 2011.07 Release Notes
GoldenGate 2011.07 Product Release Notes.

Release Notes 2011-07-12

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Advanced Graph Export
This application note describes how to customize the report to be exported in Model Builder Program (MBP). Knowledge Center login required.

Application Note 2011-07-01

Multiple Simulations in MBP
This application note describes how to compare two or more different models in Model Builder Program (MBP). Knowledge Center login required.

Application Note 2011-07-01

Generate and Tweak Corner Models
This application note describes how to generate and tweak corner models in Model Builder Program (MBP). Knowledge Center login required.

Application Note 2011-07-01

Implementing Verilog-A Models in MBP
This application note describes how to implement Verilog-A models in Model Builder Program (MBP). Knowledge Center login required.

Application Note 2011-07-01

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