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Agilent EEsof EDA Customer Education and Services
Brief overview of Agilent EEsof EDA Customer Education and Services.

Training Materials 2010-08-11

Agilent Wireless Test & Design World 2009 in Seoul, Korea
Agilent EEsof EDA related materials presented at the Agilent Wireless Test & Design World 2009

Seminar Materials 2009-07-01

Automating On-Wafer Measurements with the New Agilent IC-CAP WaferPro
Webcast slides describing on-wafer semiconductor device measurement challenges and WaferPro

Seminar Materials 2011-01-27

PDF PDF 1.05 MB
Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
Originally broadcast Jan 27, 2011

Webcast - recorded

IC-CAP User Training
This 3-day course will show device modelers how to use Agilent EEsof EDA's IC-CAP software. Click on link to view full course description and class dates and locations.

Classroom Training

IMS 2011 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue
2011 show, last June, 2011; Baltimore Convention Center

Tradeshow

IMS 2012 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue
June 17-22, 2012 in Montréal, Canada

Tradeshow

Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs)
Original broadcast Feb 2, 2012

Webcast - recorded

Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast
Original broadcast May 7, 2013

Webcast - recorded

Measurement Based FET Modeling using Artifical Neural Networks (ANN)
This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series.

Seminar Materials 2012-02-07

PDF PDF 2.51 MB
Presentation on Accurate Design of Low-Noise High-Frequency SAW Oscillators
This Presentation presents design steps which include the necessary measurements and modeling methods and the used simulation technologies in the Advanced Design System (ADS) to achieve the goal.

Seminar Materials 2001-09-01

PDF PDF 2.71 MB
Presentation on BSIM4, BSIM3v3 and BSIMSOI RF MOS Modeling
This Presentation by Dr. Thomas Gneiting (Advanced Modeling Solution) was presented at Agilent EEsof EDA Seminar, April 04, 2001 details the structure of BSIM3v3, BSIMSOI and BSIM4 RF models.

Seminar Materials 2001-04-04

PDF PDF 1.49 MB
Presentation on DC & AC Characterization of Semiconductors
This Presentation focuses on basics of device measurement and modeling techniques from DC to RF, special aspects of network analyzer calibration, de-embedding and required dummy structures.

Seminar Materials 2003-01-28

PDF PDF 893 KB
Presentation on Large Signal Model Extraction of GaAs MESFETs & GaN HEMT Devices
This Presentation describes modeling extraction steps and difficulties for small signal and large signal models using GaAs pHEMTs and GaN HEMT device data.

Seminar Materials 2008-02-26

PDF PDF 975 KB
Presentation on Large-Signal Model for GaAs And InP HBTs
This Presentation presents an overview on motivation for AgilentHBT Model; a more accurate than Gummel-Poon based models for III-V HBT devices.

Seminar Materials 2003-10-01

PDF PDF 1.26 MB
Presentation on Passive Model Library Generator (PMLG)
This Presentation presents an automated process of building models (PMLG) that has increased accuracy and generality over the analytic models; fills a gap between analytic models and EM simulations.

Seminar Materials 2000-11-01

PDF PDF 1.65 MB
Setting Up IC-CAP WaferPro For On-Wafer Measurements
originally broadcast June 22, 2011

Webcast - recorded

Setting up IC-CAP WaferPro for On-Wafer Measurements
IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements.

Seminar Materials 2011-06-22

PDF PDF 3.07 MB
What's new in IC-CAP 2010.08?
Overview of the new features included in the IC-CAP 2010.08 release.

Training Materials 2010-08-13

PDF PDF 793 KB