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Product Note B1505A-1 Creating Custom Socket Modules
This product note describes the procedure to develop custom socket modules for B1505A Power Device Analyzer/Curve Tracer to measure packaged power devices such as SMD which are not supported by an inline package.

Application Note 2009-09-09

AN B1500-14 IV and CV Characterizations of Solar/Photovoltaic Cells Using the B1500A
This application note shows how the B1500A can be used to evaluate a variety of solar cell types.

Application Note 2009-08-07

Top 5 Reasons to Use Agilent Precision SMU Products for Solar Cell Evaluation
Agilent Parameter & Device Analyzers can improve the yields and efficiencies of your solar cells.

Promotional Materials 2009-08-05

AN B1500-13 Measuring Pulsed/Transient Electrical Properties of OTFTs
This 12-page application note describes how to measure pulsed / transient electrical property of OTFT without additional measurement instruments.

Application Note 2009-05-18

TO B1500A Easy High Power Pulsed IV Measurement Using the Agilent B1500A’s HV-SPGU Module
This document describes the high power pulsed IV measurement using the B1525A high voltage semiconductor pulse generator unit for B1500A semiconductor device analyzer mainframe.

Application Note 2009-04-01

Agilent B1542A Pulsed IV parametric Test Solution

Technical Overview 2009-03-23

AN B1500-11 Characterizing Random Noise in CMOS Image Sensors
This application note describes how to characterize random noise in CMOS image sensor, and RTS noise measurement using the B1500A with the WGFMU module.

Application Note 2009-03-13

AN B1500-12 1 micro second IV Characterization of Flash Memory Cells Using the Agilent B1530A
This application note describes how the B1530A WGFMU can be used to solve the measurement challenges faced when performing high speed IV characterization of flash memory cells.

Application Note 2009-03-05

B2200A/B2201A Low-leakage Switching Mainframe
Learn about technical specifications for B2200A and B2201A Switch Mainframe.

Data Sheet 2009-02-25

Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Agilent 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

Application Note 2008-12-10

Simple and Efficient Failure Analysis Using the B1505A Power Device Analyzer/Curve Tracer
This document describes how the B1505A, with its capability to source up to 3000 V and 20 A, can be used to solve a variety of failure analysis issues.

Brochure 2008-11-03

B1505A Power Device Analyzer/Curve Tracer
This document describes the general features of the B1505A, which has a curve-tracer mode and can characterize power devices from the sub-picoamp level up to 3000 V and 20 A.

Brochure 2008-11-03

AN B1500A-10 Ultra-Fast 1 us NBTI Characterization Using the Agilent B1500A's WGFMU Module
This application note explains how the B1500's WGFMU module provides solutions that meet the needs of ultra-fast NBTI measurement.

Application Note 2008-08-31

Total Analysis Environment for Modeling
Agilent IC-CAP is flexible and high-performance software that is capable of accurate device characterization, analysis, and easy measurement, and these capabilities take on importance for today's semiconductor modeling.

Application Note 2008-08-21

High Speed Modeling System with IC-CAP
Agilent has new modeling system configurations that meet the needs of advanced semiconductor processes.

Application Note 2008-08-21

AN B1500A-9 Improving Flash Memory Cell Characterization Using the Agilent B1500A
This application note describes how the B1500A HV-SPGU module meets the needs of advanced NVM cell testing and how it can dramatically reduce test times.

Application Note 2008-05-28

E5260/E5270 Parametric Measurement Solution Programming Guide
Pogramming Guide for E5270B/E5260A/E5262A/E5263A

Programming and Syntax Guide 2008-05-01

B1500A HV-SPGU NVM Testing Demos

Demo 2008-03-26

16440A SMU/Pulse Generator Selector User's Guide
Covers operation, installation, maintenance, and specifications.

User Manual 2007-11-01

Agilent Technologies Reduces Endurance Test Time for Non-Volatile Memory Cells from Days to Hours
Enhanced Software Test Shell with EasyEXPERT Expands Testing, Characterization Capabilities

Press Materials 2007-06-28

AN B1500A-8 Multi-Channel Parallel Timing-on-the-fly NBTI Characterization Using Agilent B1500A
This four-page application note details how to implement the parallel NBTI using the B1500A by showing a preparation of the device setup for parallel testing.

Application Note 2007-04-01

Switching Matrix Product Brochure
Product brochure for the B2200A, B2201A and E5250A low-leakage switching matrices

Brochure 2007-02-15

Solving the Most Difficult Switching Challenges
This 12-page color brochure details the features and competitive advantages of the Agilent family of low-leakage switches. It also contains a switching solutions selection guide with basic technical specifications.

Brochure 2006-11-08

AN B1500A-7 Using the Agilent B1500A with a Nanoprober to Perform Failure Analysis
This application note introduces a new failure analysis technique that use nanoprobes and B1500A.

Application Note 2006-11-04

AN B1500A-6 Accurate NBTI Characterization Using Timing-on-the-Fly Sampling Mode
This four-page application note details how the B1500A and Agilent's timing-on-the-fly NBTI test method solves many of the problems associated with traditional NBTI test methods.

Application Note 2006-10-01

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