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1500 A and 10 kV MOSFET Characterization using the Agilent B1505A-apnote
This application note explains how to use the B1505A Power Device Analyzer / Curve Tracer to measure typical DC parameters of high-power MOSFETs.

Application Note 2012-08-27

PDF PDF 722 KB
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1500 A and 10 kV IGBT Characterization by using Agilent B1505A-apnote
This application note explains how to use the B1505A Power Device Analyzer / Curve Tracer to measure typical DC parameters found in IGBT specifications.

Application Note 2012-07-27

PDF PDF 654 KB
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Measuring Power BJT Electrical Characteristics using the B1505A
B1505A can measure the typical DC and capacitance parameters of power BJT devices.

Application Note 2011-08-30

PDF PDF 493 KB
Measuring Power MOSFET Electrical Characteristics using the B1505A
This application note explains how to use the B1505A to measure the typical DC and capacitance parameters of power MOSFET devices.

Application Note 2011-08-22

PDF PDF 651 KB
AN B1505A-4 Direct Power MOSFET Capacitance Measurement at 3,000 V
This application note describes direct capacitance measurement at a 3,000 V bias voltage by using the Agilent B1505A.

Application Note 2011-01-10

PDF PDF 1.14 MB
AN B1500-17 A Complete CMOS Reliability Test Solution
This application note gives an overview of the B1500A's key measurement features and shows how the B1500A is a complete solution for verifying CMOS process reliability.

Application Note 2010-06-08

PDF PDF 322 KB
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AN B1500A-2 Migrating from the Agilent 4155C and 4156C to the Agilent B1500A
This application note presents the B1500A's major features with EasyEXPERT 4.0 software and explains the differences and similarities with respect to the 4155C and 4156C.

Application Note 2010-04-02

PDF PDF 944 KB
Langues 
AN B1500-16 A Complete Solution for CMOS Device Electrical Characterization
This application note gives an overview of the B1500A's key features and it goes on to show how the B1500A is a complete solution for CMOS device electrical characterization.

Application Note 2010-03-24

PDF PDF 228 KB
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AN B1500-15 Ultra Low Current DC MOSFET Characterization at the Wafer Level
This application note describes how to precisely evaluate sub-threshold characteristics of a MOSFET device using B1500A’s ultra low current measurement capability

Application Note 2010-03-23

PDF PDF 552 KB
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AN B1505-3 Precision Power Device Evaluation at 40 Amps
This application note introduces 40A IV measurement application for power devices by using two HCSMUs installed in the B1505A.

Application Note 2010-02-24

PDF PDF 200 KB
Langues 
AN B1505-2 Next Generation Curve Tracer Revolutionizes Failure Analysis
This application note describes how the B1505A enable for checking device operation and failure analysis using curve tracer mode.

Application Note 2010-01-08

PDF PDF 1.40 MB
Langues 
AN B1505-1 Accurate and Efficient Characterization of Power Devices at 3000 V/20 A
This application note describes how to perform accurate and efficient characterization of power devices up to 3000 V/20 A by using the B1505A.

Application Note 2009-11-18

PDF PDF 1.56 MB
Langues 
PN B1500-1 Pulse/arbitrary waveform generator with integrated measurement capabilities
The Agilent B1530A WGFMU is a pulse/arbitrary waveform generator with fast current or voltage sampling capabilities. This product note introduces various measurement applications enabled by unique features of the WGFMU.

Application Note 2009-10-16

PDF PDF 1.78 MB
Langues 
Product Note B1505A-1 Creating Custom Socket Modules
This product note describes the procedure to develop custom socket modules for B1505A Power Device Analyzer/Curve Tracer to measure packaged power devices such as SMD which are not supported by an inline package.

Application Note 2009-09-09

PDF PDF 364 KB
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AN B1500-14 IV and CV Characterizations of Solar/Photovoltaic Cells Using the B1500A
This application note shows how the B1500A can be used to evaluate a variety of solar cell types.

Application Note 2009-08-07

PDF PDF 1.98 MB
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Impedance Measurement Handbook
Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers.

Application Note 2009-06-17

PDF PDF 2.02 MB
Langues 
AN B1500-13 Measuring Pulsed/Transient Electrical Properties of OTFTs
This 12-page application note describes how to measure pulsed / transient electrical property of OTFT without additional measurement instruments.

Application Note 2009-05-18

PDF PDF 238 KB
Langues 
TO B1500A Easy High Power Pulsed IV Measurement Using the Agilent B1500A’s HV-SPGU Module
This document describes the high power pulsed IV measurement using the B1525A high voltage semiconductor pulse generator unit for B1500A semiconductor device analyzer mainframe.

Application Note 2009-04-01

PDF PDF 370 KB
AN B1500-11 Characterizing Random Noise in CMOS Image Sensors
This application note describes how to characterize random noise in CMOS image sensor, and RTS noise measurement using the B1500A with the WGFMU module.

Application Note 2009-03-13

PDF PDF 952 KB
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AN B1500-12 1 micro second IV Characterization of Flash Memory Cells Using the Agilent B1530A
This application note describes how the B1530A WGFMU can be used to solve the measurement challenges faced when performing high speed IV characterization of flash memory cells.

Application Note 2009-03-05

PDF PDF 726 KB
Langues 
Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Agilent 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

Application Note 2008-12-10

PDF PDF 283 KB
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AN B1500A-10 Ultra-Fast 1 us NBTI Characterization Using the Agilent B1500A's WGFMU Module
This application note explains how the B1500's WGFMU module provides solutions that meet the needs of ultra-fast NBTI measurement.

Application Note 2008-08-31

PDF PDF 1.57 MB
Langues 
High Speed Modeling System with IC-CAP
Agilent has new modeling system configurations that meet the needs of advanced semiconductor processes.

Application Note 2008-08-21

PDF PDF 396 KB
Langues 
Total Analysis Environment for Modeling
Agilent IC-CAP is flexible and high-performance software that is capable of accurate device characterization, analysis, and easy measurement, and these capabilities take on importance for today's semiconductor modeling.

Application Note 2008-08-21

PDF PDF 428 KB
Langues 
AN B1500A-9 Improving Flash Memory Cell Characterization Using the Agilent B1500A
This application note describes how the B1500A HV-SPGU module meets the needs of advanced NVM cell testing and how it can dramatically reduce test times.

Application Note 2008-05-28

PDF PDF 1.16 MB
Langues 

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