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AN B1500A-3 IV and CV Measurement Using the Agilent B1500A MFCMU and SCUU
This application note describes how to make current-voltage and capacitance-voltage measurements using the B1500A multifrequency capacitance measurement unit and SMU CMU unify unit.

Application Note 2005-08-01

16495C/D/E/F/G/H/J Connector Plate Installation Guide
Provides installation information of 16495 Connector Plate.

Installation Manual 2005-07-01

PDF PDF 638 KB
AN B1500A-1 Measuring CNT FETs and CNT SETs Using the Agilent B1500A
The Agilent B1500A Semiconductor Device Analyzer has added benefits not found in the 4155C and 4156C.

Application Note 2005-03-31

E5260 Series Quick Reference
A 2-page quick reference guide to using the E5260A/E5262A/E5263A from the front panel.

Quick Start Guide 2004-10-01

PDF PDF 1.03 MB
E5270B 8 Slot Precision Measurement Mainframe
The E5270B is completely user-configurable. You can install up to eight single-slot modules, up to four dual-slot modules, or any physically allowable combination thereof.

Technical Overview 2004-09-01

High Speed L-I-V Test of Laser Diode Using Agilent E5272A/E5273A AN E5270-4
This application note introduces a technique of programming for high speed L-I-V test of Laser Diode in production.

Application Note 2003-10-17

Evaluation of High Voltage Characteristics of Semiconductor Processes and Devices to 400V AN E5270-3
This application note introduces a technique for expanding the output voltage using the SMU of the Agilent E5270A 8-slot Parametric Measuremnet Mainframe.

Application Note 2003-10-06

PDF PDF 544 KB
E5270B Parametric Measurement Solution Quick Reference
A 2-page quick reference guide to using the E5270B from the front panel.

Quick Start Guide 2003-10-01

PDF PDF 714 KB
Accurate High Power Device Evaluation to 4 Amperes Using Agilent E5270A AN E5270-1
This application note provides information how to obtain accurate results up to 4A using the E5270A and added flexible modules.

Application Note 2003-09-19

PDF PDF 739 KB
High Speed fT vs. Ic characterization of Bipolar transisitor Using E5270A and ENA AN E5270-2
This application note shows how to perform high-speed fT vs. Ic characterization of bipolar transistor by using Agilent E5270A and ENA series RF Network Analyzer.

Application Note 2003-08-10

Evaluation of MOS Capacitor Gate Oxide C-V Characteristics Using the Agilent 4294A(PN4294-3)
As a result of extremely high integration of logic LSIs, MOS FETs with gate lengths of 0.1 mm or less have been produced recently. A consequence of this miniaturization has been the need for very thin gate oxide layers.

Application Note 2003-06-26

Tips for Reusing Existing 4142B Program for Agilent E5270A Parametric Measurement Mainframe
The purpose of this technical overview is to provide an example of a systematic approach for finding non-operative 4142B program modules or lines in the E5270A instrument,,,

Application Note 2003-05-10

PDF PDF 310 KB
How do I connect the GND unit Agilent 41501B with the Agilent E5250A?
How do I connect the GND unit Agilent 41501B with the Agilent E5250A?

Application Note 2002-12-18

PDF PDF 20 KB
How Do I Control the Agilent E5250A?
How Do I Control the Agilent E5250A?

Application Note 2002-12-18

HTML HTML 6 KB
What is the Agilent E5250A?
What is the Agilent E5250A?

Application Note 2002-12-18

PDF PDF 29 KB
E5250A Low-leakage Switch Mainframe
Information on configurations, specifications,and other technical data.

Application Note 2002-12-11

PDF PDF 112 KB
Step by Step Measurement Handbook for Measuring Specifications of Power BJT
This power Bipolar Junction Transistor (BJT) measurement handbook covers how to measure the typical power BJT parameters found in its specifications or data sheet.

Reference Guide 2001-09-07

E5250A Low-leakage Switch Mainframe
Learn about technical specifications for E5250A Low-leakage Switch Mainframe.

Data Sheet 2000-12-01

E5250A Low Leakage Switch Mainframe Setup Guide
This Setup Guide describes the configuration for various applications. It also provides necessary information to order accessories for the E5250A.

Configuration Guide 2000-11-30

PDF PDF 1.83 MB
Evaluation of Hot Carrier Induced Degradation of Multiple MOSFET Devices. AN E5250A-2
This application note introduces you to Agilent’s new solution for evaluation of hot carrier induced degradation of multiple MOSFET devices.

Application Note 2000-11-05

Low Current Measurement with Agilent E5250A Switch Mainframe. AN E5250A-1
This application note introduces Agilent's new solution for precise characterization of multiple semiconductor devices by switching.

Application Note 2000-11-01

DC Characterization of Semiconductor Power Devices
Shows practical measurement examples of how to characterize semiconductor power devices. [Product Note 4142B-1]

Application Note 1991-09-01

PDF PDF 1.33 MB

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