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“EDA 的创新”网络研讨会：使用人工神经网络（ANN）进行基于测量的 FET 建模
Live broadcast Feb 2, 2012; 10AM Pacific / 1PM Eastern
网上直播 |
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使用最新版本 Agilent IC-CAP WaferPro 自动进行晶圆上测量
Originally broadcast Jan 27, 2011
网上直播 -- 已存档的 |
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半导体参数测试：返回到基础知识第 2 部分
The "Back to Basics Part 2" seminar provides practical tips and techniques on making fast pulse IV measurements and practical capacitance measurement considerations.
网上直播 -- 已存档的 |
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参数测试基础培训： 第 1 部分
Originally broadcast Sept 15, 2010
网上直播 -- 已存档的 |
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设置 IC-CAP WaferPro，以便进行晶圆上测量
originally broadcast June 22, 2011
网上直播 -- 已存档的 |
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Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
Originally broadcast Jan 27, 2011
网上直播 -- 已存档的 |
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Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs)
Original broadcast Feb 2, 2012
网上直播 -- 已存档的 |
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New Benchtop SMUs with Color GUI Meet Difficult Component Test Challenges
The B2900A series of SMU's provide a new high speed, cost effective measurement solution that significantly reduces test time and test cost.
网上直播 -- 已存档的 |
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New Power Device Measurement Solutions (1500 A / 10 kV)
Original broadcast June 19, 2012
网上直播 -- 已存档的 |
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Parametric Test Basic Training Part 2
Originally broadcast Jan 19, 2011
网上直播 -- 已存档的 |
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Semiconductor Parametric Test: Back to Basics Part 2
The "Back to Basics Part 2" seminar provides practical tips and techniques on making fast pulse IV measurements and practical capacitance measurement considerations.
网上直播 -- 已存档的 |
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Setting Up IC-CAP WaferPro For On-Wafer Measurements
originally broadcast June 22, 2011
网上直播 -- 已存档的 |
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Small signal, low level, DC Parametric measurements: Back to Basics Part 1
The "Back to Basics Part 1" seminar provides practical tips and techniques on making low level DC Parametric measurements.
网上直播 -- 已存档的 |
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