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E4982A LCR Meter 1 MHz to 3 GHz Migration Guide from 4287A Application Note
This migration guide describes the difference between the Agilent E4982A LCR Meter and 4287A RF LCR Meter.

Notes d’application 2012-11-21

PDF PDF 1.42 MB
Impedance and Network Analysis Application List Application Note
This document provides the information of unique and new solutions for impedance and network analysis with using Agilent impedance analyzers, LCR meters and ENA series network analyzers.

Notes d’application 2012-10-30

PDF PDF 1.11 MB
MEMS/NEMS Device Measurement Solution
Agilent helps you characterize MEMS/NEMS device.

Notes d’application 2010-09-19

Measurement of a Large Amount of Components by Using a Scanning System (AN 1369-4)
This application note highlights not only the introduction of measurement systems using a LF LCR meter and an impedance analyzer with a scanner but also how to solve issues that relate to residual impedance, which are existing in a scanning system.

Notes d’application 2009-10-28

PDF PDF 1.42 MB
Langues 
Impedance Measurement Handbook
Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers.

Notes d’application 2009-06-17

PDF PDF 2.02 MB
Langues 
Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Agilent 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

Notes d’application 2008-12-10

PDF PDF 283 KB
Langues 
Wide-Range DC Current Biased Inductance Measurement (AN 369-8)
This application note describes DC current biased inductance measurements that are more accurate and made over a wider frequency range than was previously possible.

Notes d’application 2008-11-21

PDF PDF 321 KB
Langues 
Effective Transformer/LF Coil Testing (AN 1305-3)
Transformers/LF coils have gradually become miniaturized and are used in power supply circuits and digital networks(for example, ISDN), and are manufactured in increasing volume. QA and manufacturing have to improve evaluation of transformers/LF coils, but they are faced with big measurement...

Notes d’application 2008-11-20

PDF PDF 263 KB
Langues 
Measurement of Capacitance Characteristics of Liquid Crystal Cell (AN 369-7)
This application note describes how to take best advantage of the 4284A's powerful features when measurin gcapacitance while varying an AC signal voltage applied tothe liquid crystal material under test.

Notes d’application 2008-11-20

PDF PDF 253 KB
Langues 
MEMS On-wafer Evaluation in Mass Production
This application note describes how to evaluate MEMS elements in the on-wafer stage in order to lower the total production cost in mass production.

Notes d’application 2008-11-12

PDF PDF 322 KB
Langues 
Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers (AN 1369-1)
This presents the technologies and methods for measuring permittivity and permeability. Primarily on methods that employ the impedance measurement technology.

Notes d’application 2008-10-28

PDF PDF 1.65 MB
Langues 
High Speed Modeling System with IC-CAP
Agilent has new modeling system configurations that meet the needs of advanced semiconductor processes.

Notes d’application 2008-08-21

PDF PDF 396 KB
Langues 
Contact Resistance and Insulation Resistance Measurements of Electromechanical Components (AN1305-1)
This application note describes the contact resistance and insulation resistance measurement of mechanical components.

Notes d’application 2008-04-03

PDF PDF 119 KB
Improving the Test Efficiency of the MEMS Capacitive Sensor using the E4980A
This application brief describes the features of the Agilent E4980A and how it can dramatically improve the test efficiency of MEMS capacitive sensors.

Notes d’application 2007-04-13

PDF PDF 243 KB
Langues 
Improving Test Efficiency of MEMS Electrostatic Actuator using the E4980A
This application brief describes how the Agilent E4980A can greatly improve the test efficiency of MEMS electrostatic actuators.

Notes d’application 2007-04-12

PDF PDF 206 KB
Langues 
Characterizing Electromagnetic MEMS Optical Scanner using the E4980A
This application brief describes how the Agilent E4980A can greatly improve the test efficiency of electromagnetic MEMS optical scanners.

Notes d’application 2007-04-04

PDF PDF 202 KB
Langues 
Characterizing Electromagnetic MEMS Optical Switch Actuator using the E4980A
This application brief describes how the Agilent E4980A improves the test efficiency of electromagnetic MEMS optical switch actuators.

Notes d’application 2007-04-04

PDF PDF 121 KB
Langues 
Improve Electronic Product Quality and Performance with Agilent Precision LCR Meters (AN 369-9)
This note describes the general application of passive component measurements in incoming inspection and R&D and shows the benefits of Agilent's Precision LCR Meter family; the 4284A and the 4285A 30 MHz LCR meters with digital Q capability.

Notes d’application 2006-06-26

PDF PDF 168 KB
Langues 
Effective Multitap Transformer Testing Using a Scanner (AN 1224-5)
This Application Note shows an effective multi-tap transformer measurement using a scanner and the Agilent 4263B LCR Meter.

Notes d’application 2001-11-05

PDF PDF 945 KB
Langues 
High Accuracy and Fast RF Inductor Testing (AN 369-10)
This Application Note describes solutions offered by the Agilent 4285A Precision LCR Meter for realizing these requirements. Information for accurate and fast RF inductor testing, and for practical simple test systems are discussed.

Notes d’application 2001-10-25

PDF PDF 471 KB
Langues 
Fundamentals of RF and Microwave Power Measurements (AN 64-1C)
This Application Note is for information only. Agilent no longer sells or supports these products.

Notes d’application 2001-04-16

PDF PDF 2.21 MB
Effective Electrolytic Capacitors Testing (AN 1305-4)
With increased requirements for size reduction and higher reliability design, it is becoming necessary to evaluate electrolytic capacitors employed in electronic equipment. Production volume has been increasing for circuit applications. Manufacturing and QA now have to improve their testing of...

Notes d’application 2000-11-01

PDF PDF 386 KB
Langues 
8 Hints For Successful Impedance Measurement (AN 346-4)
Selection criteria, device characteristics, fixturing and error correction etc.

Notes d’application 2000-06-01

PDF PDF 599 KB
Langues 
Effective Impedance Measurement Using OPEN/SHORT/LOAD Correction
This application note describes how to make an accurate impedance measurement by using OPEN/SHORT/LOAD correction.

Notes d’application 1998-06-01

PDF PDF 302 KB