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1-14 of 14

Correlating Impedance Measurements Among Different Types of Measurement Instruments (PN 4291-4) The 4291B is the advanced impedance analyzer which has the capability to make accurate measurements. This document discusses the data correlation between the 4291B and older instrument. Application Note 2012-04-27	PDF 51 KB
Impedance Measurement Handbook Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers. Application Note 2009-06-17	PDF 2.02 MB Languages English \| 2009-06-17 \| PDF 2.02 MB 日本語 \| 2003-10-31 \| PDF 1.70 MB 한국어 \| 2012-07-06 \| PDF 3.64 MB
Measurement of Capacitance Characteristics of Liquid Crystal Cell (AN 369-7) This application note describes how to take best advantage of the 4284A's powerful features when measurin gcapacitance while varying an AC signal voltage applied tothe liquid crystal material under test. Application Note 2008-11-20	PDF 253 KB Languages English \| 2008-11-20 \| PDF 253 KB 日本語 \| 2000-08-30 \| PDF 630 KB
New Technologies for Accurate Impedance Measurement (40Hz to 110MHz) Auto-balancing bridge method is the best technique to make an accurate impedance measurement in LF frequency. The recent technical innovation successfully expanded its upper frequency limitation from 40MHz to 110MHz. This Product Note discusses how its made and other new technologies included in... Application Note 2008-11-20	PDF 331 KB Languages English \| 2008-11-20 \| PDF 331 KB 日本語 \| 2003-07-03 \| PDF 766 KB
Achieving Fast Design Cycle Time This application note describes how fast cycle time is achieved using the impedance analyzer such as the E4991A and 4294A with the Electronic Design Automation (EDA) tools. Application Note 2008-11-13	PDF 461 KB Languages English \| 2008-11-13 \| PDF 461 KB 日本語 \| 2003-12-15 \| PDF 1.05 MB
Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers (AN 1369-1) This presents the technologies and methods for measuring permittivity and permeability. Primarily on methods that employ the impedance measurement technology. Application Note 2008-10-28	PDF 1.65 MB Languages English \| 2008-10-28 \| PDF 1.65 MB 日本語 \| 2012-05-11 \| PDF 2.76 MB
Balanced Circuit Measurement with an Impedance Analyzer/LCR Meter/Network Analyzer (AN 346-2) This application note describes the difference between a balanced circuit and an unbalanced circuit, and also explains how to make an unbalanced circuit measurement by the unbalanced instrument step by step. Application Note 2008-04-10	PDF 116 KB
Contact Resistance and Insulation Resistance Measurements of Electromechanical Components (AN1305-1) This application note describes the contact resistance and insulation resistance measurement of mechanical components. Application Note 2008-04-03	PDF 119 KB
16196A/B/C/D Correlating RF Impedance Measurements When Using SMD Test Fixtures This Product Note explains that the ability to verify the correlation of impedance measurement results is dependent on the variety of factors. Application Note 2007-03-06	PDF 516 KB Languages English \| 2007-03-06 \| PDF 516 KB 日本語 \| 2007-03-07 \| PDF 1.20 MB
Effective Multitap Transformer Testing Using a Scanner (AN 1224-5) This Application Note shows an effective multi-tap transformer measurement using a scanner and the Agilent 4263B LCR Meter. Application Note 2001-11-05	PDF 945 KB Languages English \| 2001-11-05 \| PDF 945 KB 日本語 \| 2002-06-18 \| PDF 604 KB
New Generation Analyzer Offers Exceptional and Powerful Analysis Functions for RF...(PN E4991A-1) This Product Note describes the key technology of RF impedance measurement, today's RF component evaluation methodologies and advanced features of the E4991A product. Application Note 2001-05-24	PDF 1.35 MB Languages English \| 2001-05-24 \| PDF 1.35 MB 日本語 \| 2001-06-11 \| PDF 637 KB
Evaluating Temperature Characteristics using a Temperature Chamber and the Agilent 4291B (PN 4291-2) This note introduces an efficient and highly reliable method for evaluating temperature characteristics using a combination of the 4291B RF Impedance/Material Analyzer and a Tabai Espec temperature chamber. Application Note 2000-11-01	PDF 378 KB
Effective Electrolytic Capacitors Testing (AN 1305-4) With increased requirements for size reduction and higher reliability design, it is becoming necessary to evaluate electrolytic capacitors employed in electronic equipment. Production volume has been increasing for circuit applications. Manufacturing and QA now have to improve their testing of... Application Note 2000-11-01	PDF 386 KB Languages English \| 2000-11-01 \| PDF 386 KB 日本語 \| 2000-07-17 \| PDF 408 KB
Dielectric Constant Measurement of Solid Materials (AN 380-1) This Application Note is for information only. Agilent no longer sells or supports these products. Application Note 1989-10-01	PDF 414 KB