Technical Support

Test & Measurement

A Simplified Extension of X-parameters to Describe Memory Effects for Wideband Modulated Signals Model memory effects of microwave amplifiers in the case of wideband modulated signals. Application Note 2010-05-05	PDF 616 Bytes
Solutions for Characterizing and Designing Linear Active Devices This short application brief discusses how to accurately characterize a devices’ nonlinear behavior. Application Note 2009-08-21	PDF 366 KB Languages English \| 2009-08-21 \| PDF 366 KB 日本語 \| 2009-07-27 \| PDF 1.04 MB
Extension of X-parameters to Include Long-Term Dynamic Memory Effects IEEE MTT-S International Microwave Symposium Digest, Boston Application Note 2009-06-05
Polyharmonic Distortion Modeling Application Note 2006-06-01	PDF 1.88 MB

Enroll in myAgilent
A personalized view into the information most relevant to you.
Register Your Product
Register your products for service notifications, firmware update alerts, application notes and more…
Why Buy Agilent
See how the Agilent Advantage adds value to your purchase.