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AFM/Raman System - Data Sheet
Features and benefits of the 6000ILM Raman System

Fiche signalétique 2013-05-07

PDF PDF 307 KB
Tensile Testing of Fibers using Agilent T150 UTM Quasi-static Tensile Test
The Agilent T150 UTM is a specifically designed instrument to measure the tensile properties of wide range of fibers with small cross-sectional diameters. this application note discussed testing of various fibers

Notes d’application 2013-04-08

PDF PDF 188 KB
How Much Indentation Testing is enough testing? - Application Note
Overview of how much testing is required to conclude a significant difference between two observation sets at a particular confidence level.

Notes d’application 2013-03-13

PDF PDF 220 KB
In Situ Young’s Modulus and Strain-Rate Sensitivity of Lead Free SAC 105 Solder - Application Note
Overview of how to improve the mechanical reliability of solder joints in integrated circuits, by instrumented indentation to measure the Young’s modulus (E) and strain-rate sensitivity (m) of a common lead-free solder alloy.

Notes d’application 2013-03-12

PDF PDF 186 KB
Graphene Studies: Utilization of Atomic Force Microscopy for Nanoscale Investigations of Graphene

Notes d’application 2013-03-04

PDF PDF 738 KB
Evolution of Dynamic Mechanical Properties of Nylon-PET Island-in-the-Sea Biocomponent Fibers
Study of mechanical properties of individual nylon-PET bicomponent IS fibers, with two different PET molecular weights, were characterized using the Agilent T150 UTM.

Notes d’application 2013-01-10

PDF PDF 265 KB
Rapid Hardness of Nano-Structured Metals - Application Note
A method to radiply characterize copper-nickel multilayers wherein inindividual layers vary in thickness between 1nm and 100nm is demonstrated and discussed.

Notes d’application 2013-01-03

PDF PDF 174 KB
Statistical Variation and Strain-Rate Sensitivity of the Mechanical Properties of Individual PET Fib
Overview of strain rate and sensitivity of PET fibers

Notes d’application 2012-11-14

PDF PDF 281 KB
Potential of Low Voltage Scanning Electron Microscopy Use in Archaeology and History of Art

Notes d’application 2012-11-08

PDF PDF 1.19 MB
Rapid Calibration of Area Function and Frame Stiffness with Express Test1
Overview of “frame-stiffness” and “area-function” calibrations using Express Test

Notes d’application 2012-10-29

PDF PDF 197 KB
PicoView Software Enhanced Imaging & Analysis Package
Overview of capabilities, features and benefits for PicoView AFM software.

Fiche signalétique 2012-09-06

PDF PDF 347 KB
On Characterization of Mechanical Deformation in Flexible Electronic Structures
Demonstrates how the Agilent T150 UTM has been successfully utilized to characterize nano/micro-mechanical failure in inorganic thin films on flexible substrates.

Notes d’application 2012-08-28

PDF PDF 634 KB
Friction, Phase and KFM Characterization of Functionalized Graphene Oxide

Notes d’application 2012-08-09

PDF PDF 443 KB
Using a Compact Low Voltage FE-SEM in Evaluating Materials Nano-Porosity Application Note

Notes d’application 2012-08-02

PDF PDF 470 KB
Mapping the Mechanical Properties of Alloyed Magnesium (AZ 61)
Overview of using Express Test on the G200 nanoindenter to determine the properties of individual phases within a popular magnesium alloy, AZ 61.

Notes d’application 2012-07-13

PDF PDF 155 KB
Quasistatic and Continuous Dynamic Mechanical Behavior of Bicomponent Fibers
Study of the mechanical behavior of polymer fibers

Notes d’application 2012-07-13

PDF PDF 310 KB
Imaging Organic & Biological Materials with Low Voltage Scanning Electron Microscopy

Notes d’application 2012-06-27

PDF PDF 666 KB
Graphene Oxide & Its Applications Revealed by Atomic Force Microscopy

Notes d’application 2012-06-27

PDF PDF 305 KB
Imaging Graphene via low-voltage Field Emission Scanning Electron Microscopy

Notes d’application 2012-06-26

PDF PDF 1007 KB
Different Contrast Mechanisms in SEM Imaging of Graphene

Notes d’application 2012-06-26

PDF PDF 380 KB
Low Voltage Scanning Electron Microscopy: Promises and Challenges

Notes d’application 2012-06-13

PDF PDF 426 KB
Rapid Mechanical Characterization of Low-Dielectric-Constant Films
This application note demonstrates the cumulative benefit of CSM and Express Test for Nanoindentation testing for in the semiconductor industry.

Notes d’application 2012-06-12

PDF PDF 448 KB
SMM Imaging of Dopant Structures of Semiconductor Devices

Notes d’application 2012-05-21

PDF PDF 434 KB
Mapping the Mechanical Properties
Overview of Mapping mechanical properties of 2205 Duplex Stainless Stell Using the NEW Express Test.

Notes d’application 2012-04-23

PDF PDF 289 KB
Quantitative Surface Potential Measurement Using KFM

Notes d’application 2012-04-20

PDF PDF 433 KB

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