Discutez avec un expert

Support technique

Test et mesure électronique

Recherche par numéro de modèle du produit: Exemples : 34401A, E4440A

Affiner la liste

retirer tout le raffinement

Par type de contenu

1-25 sur 33

Sort:
7500 Atomic Force Microscope (AFM) - Data Sheet

Fiche signalétique 2013-11-21

PDF PDF 997 KB
5500 Atomic Force Microscope (AFM) - Data Sheet

Fiche signalétique 2013-08-30

AFM/Raman System - Data Sheet
Features and benefits of the 6000ILM Raman System

Fiche signalétique 2013-05-07

PDF PDF 307 KB
5600LS AFM Enhanced Sample Versatility: 300mm Wafer Vacuum Chuck

Fiche signalétique 2013-03-01

PDF PDF 131 KB
5600LS AFM Enhanced Sample Versatility: 2-Inch Multi-Sample Wafer Vacuum Chuck

Fiche signalétique 2013-03-01

PDF PDF 135 KB
Revolutionary New Agilent Express Test Option
Features, benefits and specifications for the Express Test Option for the G200 indenter

Fiche signalétique 2012-03-22

PDF PDF 199 KB
Scripting Interface for Enhanced Control of Agilent AFM Systems
Agilent PicoScript is an optional scripting interface package that greatly enhances the capabilities of Agilent PicoView, the imaging and analysis software that controls all Agilent AFM systems.

Fiche signalétique 2011-12-01

PDF PDF 124 KB
6000ILM AFM Data Sheet
The Agilent 6000ILM AFM seamlessly integrates the capabilities of an atomic force microscope (AFM) with those of an inverted light microscope (ILM) or an inverted confocal microscope.

Fiche signalétique 2011-11-30

PDF PDF 711 KB
5500EC AFM for Electrochemistry Data Sheet

Fiche signalétique 2011-10-06

PDF PDF 577 KB
Post Processing Pico Image Software for Agilent AFM Systems
Pico Image surface imaging and analysis software is dedicated to Agilent AFMs and SPMs. It contains three levels for basic, advanced, and expert users. Standalone and network licenses are available.

Fiche signalétique 2011-10-05

PDF PDF 619 KB
Agilent NanoSuite 6.0
NanoSuite Data Sheet

Fiche signalétique 2011-02-09

PDF PDF 295 KB
5420 SPM/AFM Data Sheet

Fiche signalétique 2010-10-07

PDF PDF 377 KB
8500 Field Emission Scanning Electron Microscope Data Sheet

Fiche signalétique 2010-07-22

PDF PDF 245 KB
Agilent Nano Indenter G200
Agilent Nano Indenter G200 Data Sheet

Fiche signalétique 2010-02-09

PDF PDF 162 KB
Agilent T150 UTM
Agilent T150 UTM Data Sheet

Fiche signalétique 2010-02-09

PDF PDF 162 KB
Agilent Nano Indenter G300
Agilent Nano Indenter G300 Data Sheet

Fiche signalétique 2010-02-09

PDF PDF 167 KB
Liquid Cell and Sample Plate 5500 and 5100 AFM/SPM Data Sheet

Fiche signalétique 2009-12-04

PDF PDF 426 KB
New Enhanced Agilent Dynamic Contact Module II (DCM II) Option

Fiche signalétique 2009-09-22

PDF PDF 172 KB
Dynamic Contact Module (DCM)

Fiche signalétique 2009-06-11

PDF PDF 256 KB
NanoVision

Fiche signalétique 2009-06-11

PDF PDF 136 KB
Continuous Dynamic Analysis (CDA)

Fiche signalétique 2009-06-10

PDF PDF 117 KB
Continuous Stiffness Measurement (CSM)

Fiche signalétique 2009-06-05

PDF PDF 216 KB
Agilent 5600LS AFM High-Resolution Large Stage AFM Optimized for Maximum Versatility

Fiche signalétique 2009-02-03

PDF PDF 371 KB
Scanning Microwave Microscopy (SMM) Mode Highly Sensitive Imaging Mode for Calibrated Measurements

Fiche signalétique 2008-08-26

Magnetic AC Mode III - the gentle touch for AFM

Fiche signalétique 2007-12-19

PDF PDF 755 KB

1 2 Page suivante