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Test et mesure électronique

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Medalist i1000D Small Foot Print In-Circuit Test - Technical Overview
The Agilent Medalist i1000D is now fully automated with in-line capabilities. It is the smallest foot print in-circuit tester for PCBA lines.

Présentation technique 2013-03-01

PDF PDF 274 KB
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ICT System Support Delivery Options
Support delivery guidelines for Agilent In-circuit Test Systems.

Présentation technique 2012-10-16

PDF PDF 41 KB
i1000D Diagnostics Test Set - Technical Overview
The Agilent i1000 diagnostics test set (DTS) provides boundary scan, on-board programming and general digital test in a desktop form factor that makes it easy to deploy for a flexible test strategy.

Présentation technique 2012-03-26

PDF PDF 634 KB
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Test Coverage Consultant - Data Sheet
The Agilent Test Coverage Consultant is a standalone application that can be installed on your Windows® PC to enable you to quickly generate test coverage reports for your products. Agilent Test Coverage Consultant Agilent Medalist i3070 Series 5

Fiche signalétique 2011-07-14

PDF PDF 214 KB
Test Coverage Consultant - Technical Overview
This quick guide is designed to help you to get the Agilent Test Coverage Consultant up and running on your PC quickly.

Présentation technique 2010-11-17

PDF PDF 242 KB
System Spares Onsite Agreement
This is the data sheet on system spares onsite agreement for uptime support

Fiche signalétique 2010-11-15

PDF PDF 201 KB
Agilent System Uptime Support Product Guide
This data sheet describes the level of support provided under each support product number for Agilent's range of support products for in-circuit test, imaging inspection and functional test systems.

Fiche signalétique 2010-08-06

PDF PDF 238 KB
Agilent Support Agreement - Consumables Exclusion List for Alternative Functional Test
This data sheet provides a list of consumable parts not covered under the Agilent Support Agreements for In-Circuit Test, Functional Test, Automated X-Ray and Optical Inspection solutions.

Fiche signalétique 2010-07-16

PDF PDF 85 KB
Medalist i1000 In-Circuit Test System
Medalist i1000 in-circuit test (ICT) system is a low-cost in-circuit test solution for original design manufacturers who need “just-enough tests”.

Fiche signalétique 2010-06-21

PDF PDF 551 KB
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Using Bead Probes to Increase Test Access
This case study discusses how Prodrive, a Netherlands-basedelectronics manufacturer, successfully implemented the Agilent Technologies Medalist Bead Probe Technology to complement their existing test strategies.

Fiche signalétique 2008-05-08

PDF PDF 366 KB
Manufacturing Test & Inspection Services & Support
Datasheet highlighting the new Medalist Support Program for Manufacturing Test & Inspection.

Fiche signalétique 2008-04-24

PDF PDF 226 KB
What is the Medalist i1000?
The Medalist i1000 in-circuit test (ICT) system answers the manufacturers’ need for a low cost ICT solution with just enough ICT tests. Read on to learn how it compares to traditional ICT.

Présentation technique 2007-11-12