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Choose the right system calibration services for your Agilent i3070/3070 In-circuit Test System
Agilent offer a range of new calibration service with and without system calibration license to use for your Agilent i3070/3070 In-circuit Test System

Case Study 2012-09-28

Changes in Test Coverage - Article Reprint
This article discusses challenges behind in-circuit testing on modern-day high speed, high complexity PCBAs, and work-around solutions currently available.

Article 2012-08-24

PDF PDF 235 KB
ICT Total Cost of Ownership - Article Reprint
This article examines how the total cost of ICT ownership continues to change. It discusses the factors that a manufacturer should consider before making an investment.

Article 2012-08-24

PDF PDF 294 KB
Expanding Coverage with Boundary Scan - Article Reprint
Limited access tests can expand or leverage on boundary scan and provide more test coverage for a myriad of devices, beyond just boundary scan device coverage.

Article 2012-08-24

PDF PDF 206 KB
The Value of the in-Circuit Tester - Article Reprint
This article discusses how in-circuit testers for PCBAs can play a significant role to enhance product value and increase production efficiency for electronics manufacturers.

Article 2012-08-24

PDF PDF 1.04 MB
In-Circuit Test (ICT): The King Is Dead; Long Live the King!
Reports of the demise of in-circuit testing have been exaggerated for at least 20 years. Despite this, ICT is still here and kicking. This paper discusses various reasons why the King lives on.

Article 2011-11-04

PDF PDF 67 KB
Latin America: Pushing the Boundaries of Test-Article Reprint
A first-hand stock taking of the EMS scene in Brazil and Mexico from an engineer's road trip.

Article 2011-01-13

PDF PDF 966 KB
A New Equilibrium
The EMS and ODM markets are moving to a new equilibrium as they continue to balance cost pressures and technology evolution. This article looks at the trends shaping this new balance.

Article 2010-10-20

PDF PDF 192 KB
Access Entitled Content on our Agilent.com Customer Website
Customers who have active warranty or support agreement for their ICT, AXI or AOI test system can register for access to Printed Circuit Assembly Board Test and Inspection entitled content.

Newsletter 2010-05-31

Rehost Service for Agilent ICT, AXI and AOI systems
Rehost service is included as part of Agilent support agreement for hardware support or software subscription service.

Feature Story 2010-05-25

ISO9000 certified repair centers for ICT and imaging inspection systems
ISO9000 certified repair centers for ICT and imaging inspection systems

Feature Story 2009-11-16

In-Circuit Test Channel Partner Interview Series: Masterpiece Engineering
This article is the third in the series of education pieces relating to in-circuit test programming houses that Agilent works regularly with. This article features Masterpiece Engineering, from a programming house perspective.

Feature Story 2008-12-16

PDF PDF 106 KB
Next Generation ICT Solutions for Limited Access Boards
Newer, more complex printed circuit boards are creating new challenges in test accessibility. Published with kind permission of Electronic Manufacturing

Article 2008-05-29

PDF PDF 816 KB
Article reprint: Implementing Bead Probe Technology for In-Circuit Test:
A major OEM implements bead probe technology on a new design to gain test access and coverage of high-speed circuits. The experiences of a first implementation of bead probe technology are discussed here.

Article 2008-03-06

PDF PDF 1.88 MB
Article reprint: Finding Power/Ground Defects on Connectors A New Approach
This paper surveys existing tests for these defects and introduces a new solution based on Network Parameter Measurements

Article 2008-03-06

PDF PDF 199 KB
Article reprint: A Bead Probe CAD Strategy for In-Circuit Test
This paper discusses the potential of using Bead Probes in Computer Aided Design (CAD) systems when getting a board ready for production.

Article 2008-03-06

PDF PDF 606 KB
The Evolution of Vectorless Test
Written by Chris Jacobsen. Published with permission from Circuits Assembly, January 2007.

Article 2007-11-08

PDF PDF 263 KB
Evolving Packages Drive Test and Inspection
Written by Stacy Kalisz Johnson. Published with permission from Circuits Assembly, March 2007

Article 2007-08-11

PDF PDF 747 KB
Selcom Testimonial
Customer testimonial which discusses the advantages gained from using the Agilent Medalist Family of test and inspection systems.

Case Study 2005-03-14

WMF WMF 19.21 MB