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AFM/Raman System - Data Sheet
Features and benefits of the 6000ILM Raman System

Data Sheet 2013-05-07

PDF PDF 307 KB
Graphene Studies: Utilization of Atomic Force Microscopy for Nanoscale Investigations of Graphene

Application Note 2013-03-04

PDF PDF 738 KB
PicoView Software Enhanced Imaging & Analysis Package
Overview of capabilities, features and benefits for PicoView AFM software.

Data Sheet 2012-09-06

PDF PDF 347 KB
Friction, Phase and KFM Characterization of Functionalized Graphene Oxide

Application Note 2012-08-09

PDF PDF 443 KB
Graphene Oxide & Its Applications Revealed by Atomic Force Microscopy

Application Note 2012-06-27

PDF PDF 305 KB
SMM Imaging of Dopant Structures of Semiconductor Devices

Application Note 2012-05-21

PDF PDF 434 KB
Quantitative Surface Potential Measurement Using KFM

Application Note 2012-04-20

PDF PDF 433 KB
Thickness-dependent Electrical Properties of Single-layer Graphene and Few-layer Graphene
Thickness-dependent Electrical Properties of Single-layer Graphene and Few-layer Graphene: a Kelvin Force Microscopy Study

Application Note 2012-03-13

PDF PDF 389 KB
AFM Bibliography

Demo 2012-01-11

AFM Image Library

Demo 2012-01-11

Investigating Highly Dopant Marker Layers in GaN on Sapphire Using SMM

Application Note 2012-01-03

PDF PDF 448 KB
Fluorescence Guided Force Spectroscopy and Recognition Imaging on Cells Using Agilent's 6000ILM AFM

Application Note 2011-12-19

PDF PDF 394 KB
Scripting Interface for Enhanced Control of Agilent AFM Systems
Agilent PicoScript is an optional scripting interface package that greatly enhances the capabilities of Agilent PicoView, the imaging and analysis software that controls all Agilent AFM systems.

Data Sheet 2011-12-01

PDF PDF 124 KB
6000ILM AFM Data Sheet
The Agilent 6000ILM AFM seamlessly integrates the capabilities of an atomic force microscope (AFM) with those of an inverted light microscope (ILM) or an inverted confocal microscope.

Data Sheet 2011-11-30

PDF PDF 711 KB
5500EC AFM for Electrochemistry Data Sheet

Data Sheet 2011-10-06

PDF PDF 577 KB
Post Processing Pico Image Software for Agilent AFM Systems
Pico Image surface imaging and analysis software is dedicated to Agilent AFMs and SPMs. It contains three levels for basic, advanced, and expert users. Standalone and network licenses are available.

Data Sheet 2011-10-05

PDF PDF 619 KB
Topography & Recognition Imaging with the Agilent 6000ILM, an Integrated AFM/ILM

Application Note 2011-08-24

PDF PDF 234 KB
Microscopic Characterization of Few-layer Hexagonal Boron Nitride: A promising Analogue Graphene

Application Note 2011-08-16

PDF PDF 801 KB
For your convenience you can now register for a FREE PDF copy of your AFM User Manual

User Manual 2011-07-15

Dynamic Current and Conductivity Measurement Using ResiScope

Application Note 2011-06-13

PDF PDF 339 KB
Atomic Force Microscopy Studies in Various Environments

Application Note 2010-10-18

PDF PDF 890 KB
Simultaneous Topography and Fluorescence Imaging of Cells using 6000ILMAFM

Application Note 2010-10-13

PDF PDF 174 KB
5500 AFM/SPM Microscope Data sheet

Data Sheet 2010-10-12

PDF PDF 1.34 MB
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5420 SPM/AFM Data Sheet

Data Sheet 2010-10-07

PDF PDF 377 KB
Imaging DNA with 6000ILM

Application Note 2010-10-01

PDF PDF 178 KB

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