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Medalist i3070 Series 5 In-Circuit Test System
The Agilent Medalist i3070 Series 5 In-Circuit Test (ICT) provides more flexible in incorporating external circuits as well as allowing better control of external circuits.

Data Sheet 2012-09-25

PDF PDF 450 KB
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Are you getting everything from In-Circuit Test? White Paper
This white paper presents two case studies on how customers are successfully combining additional test features with ICT using Agilent i3070 Series 5 technology to maximize their ICT capabilities.

Application Note 2012-09-19

PDF PDF 7.41 MB
i3070 High Node Count Test Solution - Technical Overview
Agilent's high node count test solution allows any Agilent 3070/i3070 Series 3 or Series 5 four-module test system to be easily upgraded into an ultra-high pin count test system

Technical Overview 2012-09-07

PDF PDF 261 KB
Expanding Coverage with Boundary Scan - Article Reprint
Limited access tests can expand or leverage on boundary scan and provide more test coverage for a myriad of devices, beyond just boundary scan device coverage.

Article 2012-08-24

PDF PDF 206 KB
ICT Total Cost of Ownership - Article Reprint
This article examines how the total cost of ICT ownership continues to change. It discusses the factors that a manufacturer should consider before making an investment.

Article 2012-08-24

PDF PDF 294 KB
The Value of the in-Circuit Tester - Article Reprint
This article discusses how in-circuit testers for PCBAs can play a significant role to enhance product value and increase production efficiency for electronics manufacturers.

Article 2012-08-24

PDF PDF 1.04 MB
Changes in Test Coverage - Article Reprint
This article discusses challenges behind in-circuit testing on modern-day high speed, high complexity PCBAs, and work-around solutions currently available.

Article 2012-08-24

PDF PDF 235 KB
Medalist i3070 LED Test - Technical Overview
The Agilent Medalist i3070 light emitting diode test suite delivers excellent repeatability and accuracy in LED color and luminosity measurements and superior throughput during i3070 in-circuit test.

Technical Overview 2012-05-16

PDF PDF 345 KB
3070/i3070 DUT Power Supply Document Library
This document library contains the installation manual, programming guide and operating guide/manual of the various models of DUT power supply that are supported on the Agilent 3070/i3070 ICT systems.

User Manual 2012-01-25

In-Circuit Test (ICT): The King Is Dead; Long Live the King!
Reports of the demise of in-circuit testing have been exaggerated for at least 20 years. Despite this, ICT is still here and kicking. This paper discusses various reasons why the King lives on.

Article 2011-11-04

PDF PDF 67 KB
LED Measurement Options at ICT - Article Reprint
This paper reviews current methods and constraints of LED color testing methodologies.

Article 2011-08-08

PDF PDF 306 KB
A Primer on Test Options - Article Reprint
This paper discusses why ICT remains the best option for high-volume electronics manufacturing, with its flexibility to provide a myriad of test options to meet different manufacturing needs.

Article 2011-08-08

PDF PDF 269 KB
Test Coverage Consultant - Data Sheet
The Agilent Test Coverage Consultant is a standalone application that can be installed on your Windows® PC to enable you to quickly generate test coverage reports for your products. Agilent Test Coverage Consultant Agilent Medalist i3070 Series 5

Data Sheet 2011-07-14

PDF PDF 214 KB
How to build a fixture for use with the Agilent Cover-Extend Technology
Cover-Extend Technology is Agilent’s latest limited access solution for in-circuit test. This paper documents the necessary information for a fixture vendor to build a Cover-Extend fixture.

Application Note 2011-06-24

PDF PDF 1.09 MB
Power Supply Connections for Your CET Signal Conditioner Card Application Note
The Cover-Extend Technology signal conditioner card can be powered from various sources. The recommended sources are discussed in this application note.

Application Note 2011-06-23

PDF PDF 150 KB
Using N5747A High-Power Power Supply with the Medalist i3070 Series 5 - Application Note
This paper documents the information needed to develop and turn on a test program utilizing the new Agilent N5747A high-power power supply on the Agilent Medalist i3070 Series 5 in-circuit tester.

Application Note 2011-04-04

PDF PDF 2.39 MB
In-circuit test – Still standing strong
Nay-sayers who about a decade ago started doubting the viability of in-circuit test should look at the thriving sub-ecosystem that is supporting this manufacturing test stalwart.

Article 2011-03-11

PDF PDF 294 KB
In-Circuit Tester - N5747A High-Power Power Supply - Case Study
This paper discusses the first successful implementation of the Agilent N5747A high-power power supply on a customer product - a networking board project.

Case Study 2011-02-11

PDF PDF 1.12 MB
Agilent Medalist i3070 08.20p Software Release
The Agilent Medalist i3070 Software 08.20p release enables High Voltage Zener testing up to 60V with the ASRU Revision N card.

Release Notes 2011-02-08

Latin America: Pushing the Boundaries of Test-Article Reprint
A first-hand stock taking of the EMS scene in Brazil and Mexico from an engineer's road trip.

Article 2011-01-13

PDF PDF 966 KB
Programming In-System versus Offline-Article Reprint
Is offline programming or ISP at in-circuit test better? One key consideration is the cost of each method. This paper looks at pros and cons of these two methods contributing to the overall costing.

Article 2011-01-13

PDF PDF 159 KB
TestJet & VTEP hardware description and verification
This application note describes the TestJet and VTEP hardware components and the required connections for assembly on test fixtures. It also provides instructions for the setup and use of the Fixture Verifier.

Application Note 2010-12-22

PDF PDF 2.17 MB
Smart Meter Test Solutions - Product Overview
As smart grid adoption increases, manufacturers of smart meters will need to adopt new and better test strategies and technologies to meet board and functional test requirements and stay competitive.

Technical Overview 2010-11-29

PDF PDF 802 KB
Test Coverage Consultant - Technical Overview
This quick guide is designed to help you to get the Agilent Test Coverage Consultant up and running on your PC quickly.

Technical Overview 2010-11-17

PDF PDF 242 KB
Throughput comparison for Medalist i3070 Series 5 and i3070 In-Circuit Test
The new Medalist i3070 Series 5 in-circuit tester has several new features which enable manufacturers to speed up their tests, when compared with using the older i3070 series.

Case Study 2010-08-11

PDF PDF 175 KB

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