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Power Supply Connections for Your CET Signal Conditioner Card Application Note
The Cover-Extend Technology signal conditioner card can be powered from various sources. The recommended sources are discussed in this application note.

Application Note 2014-02-25

PDF PDF 435 KB
Agilent Medalist i3070 08.40p Software Release
Agilent Medalist i3070 08.40p software can be installed on testheads and test development stations with Windows 7 (32- bit and 64- bit) and Windows XP operating systems.

Release Notes 2014-02-17

The World’s Highest Pin Count In-Circuit Test Solutions - Brochure
Agilent's new i3070 and 3070 in-circuit test (ICT) high node count test solution is the world’s highest pin count ICT system, bringing an unprecedented level of performance and portability to users.

Brochure 2013-09-18

PDF PDF 129 KB
Medalist i3070 and 3070 In-circuit Test Fixture Accessories - Catalog
View the catalog for Agilent i3070 and 3070 in-circuit test (ICT) fixture accessories.

Catalog 2013-09-12

PDF PDF 569 KB
x1149 Boundary Scan Analyzer - Technical Overview
The Agilent x1149 boundary scan analyzer brings you better coverage, better diagnostics and best-in-class usability to your work bench to meet your boundary scan test needs.

Technical Overview 2013-07-22

PDF PDF 1.24 MB
Medalist i3070 Series 5 In-Circuit Test System
The Agilent Medalist i3070 Series 5 In-Circuit Test (ICT) provides more flexible in incorporating external circuits as well as allowing better control of external circuits.

Data Sheet 2012-09-25

Are you getting everything from In-Circuit Test? White Paper
This white paper presents two case studies on how customers are successfully combining additional test features with ICT using Agilent i3070 Series 5 technology to maximize their ICT capabilities.

Application Note 2012-09-19

PDF PDF 7.41 MB
i3070 High Node Count Test Solution - Technical Overview
Agilent's high node count test solution allows any Agilent 3070/i3070 Series 3 or Series 5 four-module test system to be easily upgraded into an ultra-high pin count test system

Technical Overview 2012-09-07

PDF PDF 261 KB
The Value of the in-Circuit Tester - Article Reprint
This article discusses how in-circuit testers for PCBAs can play a significant role to enhance product value and increase production efficiency for electronics manufacturers.

Article 2012-08-24

PDF PDF 1.04 MB
ICT Total Cost of Ownership - Article Reprint
This article examines how the total cost of ICT ownership continues to change. It discusses the factors that a manufacturer should consider before making an investment.

Article 2012-08-24

PDF PDF 294 KB
Expanding Coverage with Boundary Scan - Article Reprint
Limited access tests can expand or leverage on boundary scan and provide more test coverage for a myriad of devices, beyond just boundary scan device coverage.

Article 2012-08-24

PDF PDF 206 KB
Changes in Test Coverage - Article Reprint
This article discusses challenges behind in-circuit testing on modern-day high speed, high complexity PCBAs, and work-around solutions currently available.

Article 2012-08-24

PDF PDF 235 KB
Medalist i3070 LED Test - Technical Overview
The Agilent Medalist i3070 light emitting diode test suite delivers excellent repeatability and accuracy in LED color and luminosity measurements and superior throughput during i3070 in-circuit test.

Technical Overview 2012-05-16

PDF PDF 345 KB
3070/i3070 DUT Power Supply Document Library
This document library contains the installation manual, programming guide and operating guide/manual of the various models of DUT power supply that are supported on the Agilent 3070/i3070 ICT systems.

User Manual 2012-01-25

In-Circuit Test (ICT): The King Is Dead; Long Live the King!
Reports of the demise of in-circuit testing have been exaggerated for at least 20 years. Despite this, ICT is still here and kicking. This paper discusses various reasons why the King lives on.

Article 2011-11-04

PDF PDF 67 KB
LED Measurement Options at ICT - Article Reprint
This paper reviews current methods and constraints of LED color testing methodologies.

Article 2011-08-08

PDF PDF 306 KB
A Primer on Test Options - Article Reprint
This paper discusses why ICT remains the best option for high-volume electronics manufacturing, with its flexibility to provide a myriad of test options to meet different manufacturing needs.

Article 2011-08-08

PDF PDF 269 KB
Test Coverage Consultant - Data Sheet
The Agilent Test Coverage Consultant is a standalone application that can be installed on your Windows® PC to enable you to quickly generate test coverage reports for your products. Agilent Test Coverage Consultant Agilent Medalist i3070 Series 5

Data Sheet 2011-07-14

PDF PDF 214 KB
How to build a fixture for use with the Agilent Cover-Extend Technology
Cover-Extend Technology is Agilent’s latest limited access solution for in-circuit test. This paper documents the necessary information for a fixture vendor to build a Cover-Extend fixture.

Application Note 2011-06-24

PDF PDF 1.09 MB
Using N5747A High-Power Power Supply with the Medalist i3070 Series 5 - Application Note
This paper documents the information needed to develop and turn on a test program utilizing the new Agilent N5747A high-power power supply on the Agilent Medalist i3070 Series 5 in-circuit tester.

Application Note 2011-04-04

PDF PDF 2.39 MB
In-circuit test – Still standing strong
Nay-sayers who about a decade ago started doubting the viability of in-circuit test should look at the thriving sub-ecosystem that is supporting this manufacturing test stalwart.

Article 2011-03-11

PDF PDF 294 KB
In-Circuit Tester - N5747A High-Power Power Supply - Case Study
This paper discusses the first successful implementation of the Agilent N5747A high-power power supply on a customer product - a networking board project.

Case Study 2011-02-11

PDF PDF 1.12 MB
Agilent Medalist i3070 08.20p Software Release
The Agilent Medalist i3070 Software 08.20p release enables High Voltage Zener testing up to 60V with the ASRU Revision N card.

Release Notes 2011-02-08

Latin America: Pushing the Boundaries of Test-Article Reprint
A first-hand stock taking of the EMS scene in Brazil and Mexico from an engineer's road trip.

Article 2011-01-13

PDF PDF 966 KB
Programming In-System versus Offline-Article Reprint
Is offline programming or ISP at in-circuit test better? One key consideration is the cost of each method. This paper looks at pros and cons of these two methods contributing to the overall costing.

Article 2011-01-13

PDF PDF 159 KB

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