Technical Support: Test & Messtechnik

Using LXI to Boost Throughput in Semiconductor Manufacturing This document is a case study that discusses the successful customer implementation of an Agilent LXI solution for a multinational semiconductor manufacturer Application Note 2007-04-25	PDF 234 KB
Cathodic Protection of Steel in Concrete Using LXI This document discusss Cathodic protection as a remarkable technique that can substantially extend the life of a building structure by impeding corrosion. Application Note 2007-04-25	PDF 390 KB
Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems. Application Note 2007-02-23	PDF 234 KB Sprachen English \| 2007-02-23 \| PDF 234 KB 中文（简体） \| 2007-07-04 \| PDF 625 KB 日本語 \| 2005-02-17 \| PDF 960 KB
Defining three classes of LAN eXtensions for Instrumentation (LXI) The LXI standard defines three types of instruments that can be readily mixed and matched within a test system. Application Note 2006-01-12

Technical Support