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全新桌上型電源量測設備提供彩色 GUI，可因應困難的元件測試挑戰 Agilent B2900A 系列電源量測設備 (SMU) 提供高速、經濟實惠的量測解決方案，可大幅縮短測試時間並降低測試成本。網路廣播 -- 存檔
大幅延長使用電池之無線裝置的運作時間這個網路直播影片介紹安捷倫獨有的「無間斷量測範圍」功能，如何破除傳統電池耗電量測試技術的限制。網路廣播 -- 存檔
Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro Originally broadcast Jan 27, 2011 網路廣播 -- 存檔
Battery Run-time: Innovative Measurements / Greater Insights Webcast Original broadcast April 30, 2013 網路廣播 -- 存檔
DC Power supply fundamentals to get the most out of your applications With modern performance and safety features in power supplies, the flexibility exists to create test setups that are simpler and more effective. This web seminar covers 10 fundamentals about your power supply to take advantage of these features. 網路廣播 -- 存檔
Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs) Original broadcast Feb 2, 2012 網路廣播 -- 存檔
Modern Remote and Wireless Test Setup and Considerations This seminar describes remote/wireless test setups and configurations with LXI compliant instruments with low cost, off the shelf network products. We review local and long distance wireless test, security hurdles and using smart devices and clouds. 網路廣播 -- 存檔
New Benchtop SMUs with Color GUI Meet Difficult Component Test Challenges Webcast Originally broadcast June 16, 2011 網路廣播 -- 存檔
New Power Device Measurement Solutions (1500 A / 10 kV) Original broadcast June 19, 2012 網路廣播 -- 存檔
Optimise UE design for greater battery run-time This web seminar will discuss the challenges of verifying battery consumption during different UE operating modes and the tools available to measure the effects in power consumption. 網路廣播 -- 存檔
Optimize UE Design for Greater Battery Run-Time Original broadcast April 26, 2012 網路廣播
Optimize Wireless Device Battery Run-time: Two Part Webcast Series Original roadcasts Aug 22 & Sept 19, 2012 網路廣播 -- 存檔
Optimizing Battery Operating Time of Wireless Devices Original broadcast Aug 10, 2011 網路廣播 -- 存檔
Optimizing Battery Operating Time of Wireless Devices This webcast will go on to discuss an Agilent exclusive feature called "seamless measurement ranging" which overcomes the limitations of traditional techniques for battery current drain testing. 網路廣播 -- 存檔
Parametric Test Basic Training Part 2 Originally broadcast Jan 19, 2011 網路廣播 -- 存檔
Semiconductor Parametric Test: Back to Basics Part 2 The "Back to Basics Part 2" seminar provides practical tips and techniques on making fast pulse IV measurements and practical capacitance measurement considerations. 網路廣播 -- 存檔
Setting Up IC-CAP WaferPro For On-Wafer Measurements originally broadcast June 22, 2011 網路廣播 -- 存檔
Simulating Power Transients and Noise Original broadcast Jun 21, 2012 網路廣播 -- 存檔
Small signal, low level, DC Parametric measurements: Back to Basics Part 1 The "Back to Basics Part 1" seminar provides practical tips and techniques on making low level DC Parametric measurements. 網路廣播 -- 存檔
The Fundamentals of IV Measurement Live broadcast Apr 10, 2012; 10am Pacific / 1pm Eastern 網路廣播
Today’s Power Supplies: Meeting Basic and Sophisticated Application Requirements Originally broadcast June 29, 2011 網路廣播 -- 存檔
Ubiquitous Test with LXI Instrumentation Original broadcast Nov 2, 2011 網路廣播 -- 存檔

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