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The parametric Measurement Handbook - 3rd Edition
The parametric Measurement Handbook - 3rd Edition

Brochure 2012-02-29

B1542A Pulsed IV Package User's Guide
Covers operation, installation, and reference information of Pulsed IV Package for B1500A/EasyEXPERT.

User Manual 2012-02-01

PDF PDF 4.16 MB
E5260/E5270 Parametric Measurement Solution VXIplug&play Driver User's Guide
VXIplug&play Driver User's Guide for E5270B/E5260A/E5262A/E5263A

Programming and Syntax Guide 2011-08-01

PDF PDF 965 KB
E5260/E5270 Parametric Measurement Solution User's Guide
User's Guide for E5270B/E5260A/E5262A/E5263A

User Manual 2011-08-01

PDF PDF 2.10 MB
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Top 5 Reasons to Use Agilent Precision SMU Products for Solar Cell Evaluation
Agilent Parameter & Device Analyzers can improve the yields and efficiencies of your solar cells.

Promotional Materials 2009-08-05

PDF PDF 539 KB
E5260/E5270 Parametric Measurement Solution Programming Guide
Pogramming Guide for E5270B/E5260A/E5262A/E5263A

Programming and Syntax Guide 2008-05-01

PDF PDF 1.27 MB
Languages 
E5262A/E5263A 2 Channel Source/Monitor Unit
E5262A/E5263A is 2-Channel Source/Monitor Unit. E5262A provides two medium power SMU. E5263A provides one medium power SMU and one high power SMU.

Technical Overview 2006-08-21

PDF PDF 184 KB
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Technical Overview :Technique for Controlling Agilent External DC Power Supply
Technique for Controlling Agilent External DC Power Supply From SMU to expand SMU output power capability.

Application Note 2006-08-01

PDF PDF 1.01 MB
16442B Test Fixture User's Guide
Provides installation information, operation, maintenance information, and specification on the 16442B Test Fixture.

User Manual 2006-07-01

PDF PDF 555 KB
16495C/D/E/F/G/H/J Connector Plate Installation Guide
Provides installation information of 16495 Connector Plate.

Installation Manual 2005-07-01

PDF PDF 638 KB
E5260 Series Quick Reference
A 2-page quick reference guide to using the E5260A/E5262A/E5263A from the front panel.

Quick Start Guide 2004-10-01

PDF PDF 1.03 MB
High Speed L-I-V Test of Laser Diode Using Agilent E5272A/E5273A AN E5270-4
This application note introduces a technique of programming for high speed L-I-V test of Laser Diode in production.

Application Note 2003-10-17

PDF PDF 170 KB
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Evaluation of High Voltage Characteristics of Semiconductor Processes and Devices to 400V AN E5270-3
This application note introduces a technique for expanding the output voltage using the SMU of the Agilent E5270A 8-slot Parametric Measuremnet Mainframe.

Application Note 2003-10-06

PDF PDF 544 KB
Accurate High Power Device Evaluation to 4 Amperes Using Agilent E5270A AN E5270-1
This application note provides information how to obtain accurate results up to 4A using the E5270A and added flexible modules.

Application Note 2003-09-19

PDF PDF 739 KB
High Speed fT vs. Ic characterization of Bipolar transisitor Using E5270A and ENA AN E5270-2
This application note shows how to perform high-speed fT vs. Ic characterization of bipolar transistor by using Agilent E5270A and ENA series RF Network Analyzer.

Application Note 2003-08-10

PDF PDF 177 KB
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Tips for Reusing Existing 4142B Program for Agilent E5270A Parametric Measurement Mainframe
The purpose of this technical overview is to provide an example of a systematic approach for finding non-operative 4142B program modules or lines in the E5270A instrument,,,

Application Note 2003-05-10

PDF PDF 310 KB