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Test y Medida

Improving Coverage for ECU Outliers - Article Reprint This article explores how to catch electronic faults that typically escape with traditional serial testing, by using a multiple-channel voltage acquisition method that can enable faster parallel test. Article 2012-08-24	PDF 191 KB
Frost & Sullivan Movers and Shakers Interview with Larry Desjardin Published with kind permission of Frost & Sullivan Article 2010-12-03	PDF 521 KB

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