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IC-CAP Device Modeling Software
Technical overview of Agilent's Integrated Circuit Characterization and Analysis Program (IC-CAP), complete and accurate parameter extraction for semiconductor device modeling

技術總覽 2012-12-20

Agilent EEsof EDA Premier Communications Design Software
Agilent EEsof EDA premier communications design software product overview brochure.

型錄 2011-08-03

PDF PDF 1.92 MB
Automated Measurement with IC-CAP
This application note describes a seamless solution for automated measurement and parameter extraction with Agilent IC-CAP

應用手冊 2011-01-10

Agilent Introduces IC-CAP WaferPro Software for Automating Complex Device Modeling Applications
IC-CAP WaferPro provides a multi-site, multi-wafer, automated DC and RF measurement solution for semiconductor device modeling applications.

新聞資料 2010-08-19

Agilent EEsof EDA Device Model Support
Agilent EEsof EDA device model support table introduction.

選購指南 2010-08-19

Agilent Software Enables Successful Development of Hua Hong NEC's RF Device Modeling Platform

新聞資料 2010-06-11

IC-CAP Modeling Handbook
Reference guide for modeling engineers interested in learning the basic and advanced techniques of device and process modeling.

參考指南 2009-10-05

Agilent EEsof EDA Documentation
Agilent EEsof EDA Product Documentation.

參考指南 2009-06-16

Technical Support Documents & Examples
A database of technical support documents, solutions, and examples written by support engineers.

參考指南 2009-02-10

Agilent Technologies Offers First Commercial Package to Extract Device Models from Semiconductor Pro
Target Modeling Package for IC-CAP Enables Faster IC Design

新聞資料 2008-02-26

Agilent EEsof EDA Customer Support Brochure

型錄 2005-02-01

PDF PDF 397 KB
Resonext Communication uses IC-CAP Modeling Software – A Customer Success Story
A Customer Success Story by Ali Rezvani Director of Device Characterization and Modeling (Resonext Communication) on how by using ICCAP they saved engineering time and development costs.

案例研究 2001-11-21

PDF PDF 348 KB