Discutez avec un expert

Technical Support

IC-CAP Device Modeling Software

Find by Product Model Number: Examples: 34401A, E4440A

View Product Collection Details

Refine the List

retirer tout le raffinement

By Type of Content

Par catégorie de produit

1-16 of 16

Sort:
Agilent EEsof EDA Customer Support Brochure
Whether you are a novice or an experienced user, Agilent EEsof EDA’s customer support offerings are designed to help you every step of the way.

Brochure 2013-05-28

PDF PDF 681 KB
IC-CAP Device Modeling Software
Technical overview of Agilent's Integrated Circuit Characterization and Analysis Program (IC-CAP), complete and accurate parameter extraction for semiconductor device modeling

Technical Overview 2012-12-20

PDF PDF 1.98 MB
Langues 
Agilent Technologies Unveils New IC-CAP Platform for Device Characterization and Modeling
Agilent announces the latest release of its device modeling software platform, the Integrated Circuit Characterization and Analysis Program (IC-CAP).

Press Materials 2012-12-18

Agilent Technologies Ships New Software for Generating and Qualifying SPICE Models
Agilent today announced shipment of its first release of the industry-leading SPICE modeling tools it obtained through the acquisition of Accelicon Technologies in February.

Press Materials 2012-08-23

Agilent Announces Shipment of the IC-CAP 2012 Platform for Device Characterization and Modeling
Agilent announces shipment of the latest release of its device modeling software platform, the Integrated Circuit Characterization and Analysis Program (IC-CAP) for 2012.

Press Materials 2012-03-02

Agilent EEsof EDA Premier Communications Design Software
Agilent EEsof EDA premier communications design software product overview brochure.

Brochure 2011-08-03

PDF PDF 1.92 MB
Automated Measurement with IC-CAP
This application note describes a seamless solution for automated measurement and parameter extraction with Agilent IC-CAP

Application Note 2011-01-10

PDF PDF 1.42 MB
Langues 
IC-CAP WaferPro: A New Software Environment for Automated DC/CV and RF Measurements in IC-CAP
IC-CAP white paper on a new software environment (WaferPro) for automated DC/CV and RF measurements in IC-CAP

Application Note 2010-09-15

PDF PDF 650 KB
Langues 
Agilent EEsof EDA Device Model Support
Agilent EEsof EDA device model support table introduction.

Selection Guide 2010-08-19

Agilent Introduces IC-CAP WaferPro Software for Automating Complex Device Modeling Applications
IC-CAP WaferPro provides a multi-site, multi-wafer, automated DC and RF measurement solution for semiconductor device modeling applications.

Press Materials 2010-08-19

Agilent Software Enables Successful Development of Hua Hong NEC's RF Device Modeling Platform

Press Materials 2010-06-11

IC-CAP Modeling Handbook
Reference guide for modeling engineers interested in learning the basic and advanced techniques of device and process modeling.

Reference Guide 2009-10-05

Agilent EEsof EDA Documentation
Agilent EEsof EDA Product Documentation.

Reference Guide 2009-06-16

Technical Support Documents & Examples
A database of technical support documents, solutions, and examples written by support engineers.

Reference Guide 2009-02-10

Agilent Technologies Offers First Commercial Package to Extract Device Models from Semiconductor Pro
Target Modeling Package for IC-CAP Enables Faster IC Design

Press Materials 2008-02-26

Resonext Communication uses IC-CAP Modeling Software – A Customer Success Story
A Customer Success Story by Ali Rezvani Director of Device Characterization and Modeling (Resonext Communication) on how by using ICCAP they saved engineering time and development costs.

Case Study 2001-11-21

PDF PDF 348 KB