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Parametric Test Systems

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Agilent 4082F Flash Memory Cell Parametric Test System
This 22-page data sheet details the features, capabilities and specifications of the Agilent 4082F Flash Memory Cell Parametric Test System.

Data Sheet 2011-12-19

PDF PDF 620 KB
Agilent 4082A Parametric Test System
The 4082A Parametric Test System is designed to perform fast and precise DC measurements, capacitance measurements, and other high frequency applications such as ring oscillator measurements.

Data Sheet 2011-11-11

PDF PDF 854 KB
Accurate Capacitance Characterization at the Wafer Level
This application note describes the procedures required to precisely evaluate the capacitance of a Device Under Test (DUT) when using a 4080 series tester with an automatic wafer prober.

Application Note 2011-02-08

PDF PDF 1.61 MB
Making Matching Measurements for Use in IC Design
This application note addresses the issue of component matching from a measurement perspective, and it explains how to utilize Agilent 4080 series parametric test systems to make these measurements.

Application Note 2011-02-08

PDF PDF 3.57 MB
Low Current Measurement Technologies in Agilent 4080 Parametric Test System
This technical overview describes how the 4080 series parametric test systems attain such ultra-low current measurement performance and high throughput by focusing on the several key items.

Application Note 2011-02-08

PDF PDF 1.47 MB
Accurate and Efficient Frequency Evaluation of a Ring Oscillator
This application note introduces a precise and fast measurement method to measure the oscillation frequency of a ring oscillator structure using a spectrum analyzer in the 4080 series tester.

Application Note 2011-02-06

PDF PDF 331 KB
High Speed Parametric Test using Agilent 4080 Series Tester
This application note describes know-how and techniques to make high speed parametric testing for semiconductor device characterizations by using the Agilent 4080 series parametric test systems.

Application Note 2011-02-06

PDF PDF 913 KB
System Product User Manual
The latest manual is available as needed to customers with in-force service and support contracts.

User Manual 2009-03-19

TXT TXT 1 KB
Are You Ready to Migrate to the Platform that Solves Your Toughest Test Challenges?
The 4080 overcomes advanced measurement challenges with faster system architecture, synchronous and asynchronous parallel test capabilities, high-voltage semiconductor pulse generator units, automated RF calibration, and an optional 20 GHz RF matrix.

Brochure 2008-08-25

PDF PDF 1.39 MB
A Complete Solution for Evaluating Write/Erase Characteristics of Flash Memory Cells
This application note describes how to use the Agilent 4082F Flash Memory Cell Test System and its high-voltage semiconductor pulse generator units to characterize state-of-the-art flash memory technologies such as MLC and high-density NAND flash.

Application Note 2008-01-23

PDF PDF 957 KB
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